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Friction measurement on free standing plates using atomic force microscopy

A method is introduced to measure friction on small, free standing objects, specifically microfabricated silicon plates, based on atomic force microscopy (AFM). An AFM tip is brought into contact with the plate resting on a substrate. The substrate is displaced laterally and, provided the AFM tip do...

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Published in:	Review of scientific instruments 2013-01, Vol.84 (1), p.013702-013702
Main Authors:	Tang, X S, Loke, Y C, Lu, P, Sinha, Sujeet K, O'Shea, S J
Format:	Article
Language:	English
Subjects:	Atomic force microscopy Friction Friction measurement Loads (forces) Nanocomposites Nanomaterials Nanostructure Plates
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description	A method is introduced to measure friction on small, free standing objects, specifically microfabricated silicon plates, based on atomic force microscopy (AFM). An AFM tip is brought into contact with the plate resting on a substrate. The substrate is displaced laterally and, provided the AFM tip does not slide over the plate, the twisting of the AFM cantilever is used to measure the friction of the underlying plate-substrate interface. The method can measure nano-Newton to micro-Newton forces (both friction and applied load) and provides a means to measure friction of macroscopic structures at low load.
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source	American Institute of Physics (AIP) Publications; American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects	Atomic force microscopy Friction Friction measurement Loads (forces) Nanocomposites Nanomaterials Nanostructure Plates
title	Friction measurement on free standing plates using atomic force microscopy
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