Buckling Of Thin Film Thermoelectrics

This work investigates buckling behavior of thin film thermoelectrics subjected to a temperature gradient. Both a single-layer thermoelectric film and multilayered structures are studied. The multilayered structure consists of a p-type and n-type thermocouple separated by an insulating layer with or...

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Bibliographic Details
Published in:International journal of fracture 2013-03, Vol.180 (1), p.129-136
Main Author: Jin, Z.-H.
Format: Article
Language:English
Subjects:
Automotive Engineering
Buckling
Characterization and Evaluation of Materials
Chemistry and Materials Science
Civil Engineering
Classical Mechanics
Cold junctions
Fracture mechanics
Insulating layers
Laminates
Letters in Fracture and Micromechanics
Materials Science
Mechanical Engineering
Membranes
Monolayers
Temperature
Temperature gradients
Thermocouples
Thermoelectricity
Thickness
Thin films
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Summary:This work investigates buckling behavior of thin film thermoelectrics subjected to a temperature gradient. Both a single-layer thermoelectric film and multilayered structures are studied. The multilayered structure consists of a p-type and n-type thermocouple separated by an insulating layer with or without additional supporting membrane layers. The temperatures, and thermoelectrically induced stresses and membrane forces are first presented. The elastic stability theories of homogeneous plates and laminated composites are subsequently used to determine the temperature differential between the hot and cold junctions that causes buckling of the thin film structures. The numerical results show that a single-layer thermoelectric film could buckle at a temperature differential of around 10 K for large length-to-thickness ratios. The multilayered thermoelectric thin film structures exhibit significantly higher buckling temperature differentials due to reduced overall length-to-thickness ratios.
ISSN:0376-9429
1573-2673
DOI:10.1007/s10704-012-9798-8