Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis

Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-z...

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Bibliographic Details
Published in:Bulletin of the Polish Academy of Sciences. Technical sciences 2013-06, Vol.61 (2), p.535-539
Main Authors: Babicz, S, Smulko, J, Zielinski, A
Format: Article
Language:English
Subjects:
Approximation
Fourier analysis
Harmonics
Mathematical analysis
Recording
Taylor series
Van der Waals forces
Vibration
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Summary:Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its non-linear response. The first studies of spectrum showed that presence of the second and the third harmonics in cantilever vibrations may be observed and used as a new method of the investigated samples characterization.
ISSN:0239-7528
2300-1917
DOI:10.2478/bpasts-2013-0053