Reducing test-data volume and test-power simultaneously in LFSR reseeding-based compression environment

This paper presents a new test scheme based on scan block encoding in a linear feedback shift register （LFSR） reseeding-based compression environment.Meanwhile,our paper also introduces a novel algorithm of scan-block clustering.The main contribution of this paper is a flexible test-application fram...

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Bibliographic Details
Published in:Journal of semiconductors 2011-07, Vol.32 (7), p.115-121
Main Author: 王伟征 邝继顺 尤志强 刘鹏
Format: Article
Language:English
Subjects:
Algorithms
Benchmarks
Blocking
Compression tests
Hardware
LFSR
Linear feedback shift registers
Semiconductors
Switching
功率
压缩
播种
数据量
测试计划
环境扫描
线性反馈移位寄存器
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Summary:This paper presents a new test scheme based on scan block encoding in a linear feedback shift register （LFSR） reseeding-based compression environment.Meanwhile,our paper also introduces a novel algorithm of scan-block clustering.The main contribution of this paper is a flexible test-application framework that achieves significant reductions in switching activity during scan shift and the number of specified bits that need to be generated via LFSR reseeding.Thus,it can significantly reduce the test power and test data volume.Experimental results using Mintest test set on the larger ISCAS＇89 benchmarks show that the proposed method reduces the switching activity significantly by 72%-94%and provides a best possible test compression of 74%-94%with little hardware overhead.
ISSN:1674-4926
DOI:10.1088/1674-4926/32/7/075009