Morphology, structure, and composition of polycrystalline CdTe films grown on three-dimensional silicon substrates

Polycrystalline CdTe films have been produced on various substrates (glass, ITO-coated glass, sapphire, and microtextured silicon) by quasi-closed space growth, and their structural perfection and surface morphology have been studied by optical microscopy and scanning electron microscopy. Using an e...

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Bibliographic Details
Published in:Inorganic materials 2013-04, Vol.49 (4), p.329-334
Main Authors: Il’chuk, G. A., Kurilo, I. V., Petrus’, R. Yu, Kus’nezh, V. V., Stan’ko, T. N.
Format: Article
Language:English
Subjects:
Cadmium
Cadmium tellurides
Chemistry
Chemistry and Materials Science
Glass
Industrial Chemistry/Chemical Engineering
Inorganic Chemistry
Materials Science
Morphology
Scanning electron microscopy
Silicon substrates
Three dimensional
X-rays
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Summary:Polycrystalline CdTe films have been produced on various substrates (glass, ITO-coated glass, sapphire, and microtextured silicon) by quasi-closed space growth, and their structural perfection and surface morphology have been studied by optical microscopy and scanning electron microscopy. Using an energy dispersive X-ray spectrometer and the scanning electron microscope, we have obtained the X-ray emission spectra of the CdTe films and determined their elemental composition. The morphological features of the films have been investigated and the cadmium-to-tellurium atomic ratio in the films has been determined experimentally.
ISSN:0020-1685
1608-3172
DOI:10.1134/S0020168513030059