An embeddable SOC real-time prediction technology for TDDB

This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,designed by using a standard CMOS process,occupies a small silicon area and does no...

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Bibliographic Details
Published in:Journal of semiconductors 2012-11, Vol.33 (11), p.105-109
Main Author: 辛维平 庄奕琪 李晓明
Format: Article
Language:English
Subjects:
Circuit design
Circuits
CMOS
Real time
Semiconductors
Silicon
SOC
TDDB
Warning
占地面积
实时预测
嵌入式
工艺设计
警告信号
预报技术
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Summary:This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,designed by using a standard CMOS process,occupies a small silicon area and does not share any signal with the circuits under test,therefore,the possibility of interference with the surrounding circuits is safely excluded.
ISSN:1674-4926
DOI:10.1088/1674-4926/33/11/115009