Loading…
Surface Energy Engineered, High-Resolution Micropatterning of Solution-Processed Reduced Graphene Oxide Thin Films
Fast and reproducible patterning of high‐resolution rGO microstructures over a large area directly on various substrates by modulating the surface energy is reported. The pattern formation of rGO thin films is based on the difference in the adhesion strength between the mold/rGO and rGO/substrates i...
Saved in:
Published in: | Advanced materials (Weinheim) 2013-02, Vol.25 (6), p.894-898 |
---|---|
Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c4561-b44185f8e6f99f7e31d8ca4dd4f72ad1a1c439ac15a570361904cbac50d5faa33 |
---|---|
cites | cdi_FETCH-LOGICAL-c4561-b44185f8e6f99f7e31d8ca4dd4f72ad1a1c439ac15a570361904cbac50d5faa33 |
container_end_page | 898 |
container_issue | 6 |
container_start_page | 894 |
container_title | Advanced materials (Weinheim) |
container_volume | 25 |
creator | Kim, Nam Hee Kim, Beom Jun Ko, Yeongun Cho, Jeong Ho Chang, Suk Tai |
description | Fast and reproducible patterning of high‐resolution rGO microstructures over a large area directly on various substrates by modulating the surface energy is reported. The pattern formation of rGO thin films is based on the difference in the adhesion strength between the mold/rGO and rGO/substrates interfaces. Such highly defined rGO micropatterns are applied as electrodes for high‐performance flexible and transparent OFETs. |
doi_str_mv | 10.1002/adma.201203881 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1439767720</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1285462392</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4561-b44185f8e6f99f7e31d8ca4dd4f72ad1a1c439ac15a570361904cbac50d5faa33</originalsourceid><addsrcrecordid>eNqFkUtPGzEUha2qVUmBbZfVLLvopH7PeBkRGCpBKRDK0nLs68TtPII9o5J_30FJo-5YncX9vrO4B6GPBE8JxvSrcY2ZUkwoZmVJ3qAJEZTkHCvxFk2wYiJXkpdH6ENKvzDGSmL5Hh1RRqgghE1QvB-iNxay8xbiajvGKrQAEdyX7DKs1vkdpK4e-tC12XWwsduYvofYhnaVdT6739_yH7GzkBK47A7cYMesotmsoYXs5jk4yBbr0GYXoW7SCXrnTZ3gdJ_H6OHifHF2mV_dVN_OZle55UKSfMk5KYUvQXqlfAGMuNIa7hz3BTWOGGI5U8YSYUSBmSQKc7s0VmAnvDGMHaPPu95N7J4GSL1uQrJQ16aFbkiajHohi2J83asoLQWXlCk6otMdOv4ipQheb2JoTNxqgvXLJPplEn2YZBQ-7buHZQPugP_bYATUDvgTati-Uqdn8-vZ_-X5zg2ph-eDa-JvLQtWCP34vdK3VTWf_xQL_cj-AtGkqA0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1285462392</pqid></control><display><type>article</type><title>Surface Energy Engineered, High-Resolution Micropatterning of Solution-Processed Reduced Graphene Oxide Thin Films</title><source>Wiley:Jisc Collections:Wiley Read and Publish Open Access 2024-2025 (reading list)</source><creator>Kim, Nam Hee ; Kim, Beom Jun ; Ko, Yeongun ; Cho, Jeong Ho ; Chang, Suk Tai</creator><creatorcontrib>Kim, Nam Hee ; Kim, Beom Jun ; Ko, Yeongun ; Cho, Jeong Ho ; Chang, Suk Tai</creatorcontrib><description>Fast and reproducible patterning of high‐resolution rGO microstructures over a large area directly on various substrates by modulating the surface energy is reported. The pattern formation of rGO thin films is based on the difference in the adhesion strength between the mold/rGO and rGO/substrates interfaces. Such highly defined rGO micropatterns are applied as electrodes for high‐performance flexible and transparent OFETs.</description><identifier>ISSN: 0935-9648</identifier><identifier>EISSN: 1521-4095</identifier><identifier>DOI: 10.1002/adma.201203881</identifier><identifier>PMID: 23125113</identifier><language>eng</language><publisher>Weinheim: WILEY-VCH Verlag</publisher><subject>Adhesive strength ; Electrodes ; Graphene ; Graphite - chemistry ; micropatterning ; Molds ; OFETs ; Oxides ; Oxides - chemistry ; Patterning ; reduced graphene oxide ; Semiconductors ; Solutions - chemistry ; Surface energy ; Thermodynamics ; Thin films ; work of adhesion</subject><ispartof>Advanced materials (Weinheim), 2013-02, Vol.25 (6), p.894-898</ispartof><rights>Copyright © 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4561-b44185f8e6f99f7e31d8ca4dd4f72ad1a1c439ac15a570361904cbac50d5faa33</citedby><cites>FETCH-LOGICAL-c4561-b44185f8e6f99f7e31d8ca4dd4f72ad1a1c439ac15a570361904cbac50d5faa33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/23125113$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Kim, Nam Hee</creatorcontrib><creatorcontrib>Kim, Beom Jun</creatorcontrib><creatorcontrib>Ko, Yeongun</creatorcontrib><creatorcontrib>Cho, Jeong Ho</creatorcontrib><creatorcontrib>Chang, Suk Tai</creatorcontrib><title>Surface Energy Engineered, High-Resolution Micropatterning of Solution-Processed Reduced Graphene Oxide Thin Films</title><title>Advanced materials (Weinheim)</title><addtitle>Adv. Mater</addtitle><description>Fast and reproducible patterning of high‐resolution rGO microstructures over a large area directly on various substrates by modulating the surface energy is reported. The pattern formation of rGO thin films is based on the difference in the adhesion strength between the mold/rGO and rGO/substrates interfaces. Such highly defined rGO micropatterns are applied as electrodes for high‐performance flexible and transparent OFETs.</description><subject>Adhesive strength</subject><subject>Electrodes</subject><subject>Graphene</subject><subject>Graphite - chemistry</subject><subject>micropatterning</subject><subject>Molds</subject><subject>OFETs</subject><subject>Oxides</subject><subject>Oxides - chemistry</subject><subject>Patterning</subject><subject>reduced graphene oxide</subject><subject>Semiconductors</subject><subject>Solutions - chemistry</subject><subject>Surface energy</subject><subject>Thermodynamics</subject><subject>Thin films</subject><subject>work of adhesion</subject><issn>0935-9648</issn><issn>1521-4095</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkUtPGzEUha2qVUmBbZfVLLvopH7PeBkRGCpBKRDK0nLs68TtPII9o5J_30FJo-5YncX9vrO4B6GPBE8JxvSrcY2ZUkwoZmVJ3qAJEZTkHCvxFk2wYiJXkpdH6ENKvzDGSmL5Hh1RRqgghE1QvB-iNxay8xbiajvGKrQAEdyX7DKs1vkdpK4e-tC12XWwsduYvofYhnaVdT6739_yH7GzkBK47A7cYMesotmsoYXs5jk4yBbr0GYXoW7SCXrnTZ3gdJ_H6OHifHF2mV_dVN_OZle55UKSfMk5KYUvQXqlfAGMuNIa7hz3BTWOGGI5U8YSYUSBmSQKc7s0VmAnvDGMHaPPu95N7J4GSL1uQrJQ16aFbkiajHohi2J83asoLQWXlCk6otMdOv4ipQheb2JoTNxqgvXLJPplEn2YZBQ-7buHZQPugP_bYATUDvgTati-Uqdn8-vZ_-X5zg2ph-eDa-JvLQtWCP34vdK3VTWf_xQL_cj-AtGkqA0</recordid><startdate>20130213</startdate><enddate>20130213</enddate><creator>Kim, Nam Hee</creator><creator>Kim, Beom Jun</creator><creator>Ko, Yeongun</creator><creator>Cho, Jeong Ho</creator><creator>Chang, Suk Tai</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><scope>BSCLL</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20130213</creationdate><title>Surface Energy Engineered, High-Resolution Micropatterning of Solution-Processed Reduced Graphene Oxide Thin Films</title><author>Kim, Nam Hee ; Kim, Beom Jun ; Ko, Yeongun ; Cho, Jeong Ho ; Chang, Suk Tai</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4561-b44185f8e6f99f7e31d8ca4dd4f72ad1a1c439ac15a570361904cbac50d5faa33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Adhesive strength</topic><topic>Electrodes</topic><topic>Graphene</topic><topic>Graphite - chemistry</topic><topic>micropatterning</topic><topic>Molds</topic><topic>OFETs</topic><topic>Oxides</topic><topic>Oxides - chemistry</topic><topic>Patterning</topic><topic>reduced graphene oxide</topic><topic>Semiconductors</topic><topic>Solutions - chemistry</topic><topic>Surface energy</topic><topic>Thermodynamics</topic><topic>Thin films</topic><topic>work of adhesion</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Nam Hee</creatorcontrib><creatorcontrib>Kim, Beom Jun</creatorcontrib><creatorcontrib>Ko, Yeongun</creatorcontrib><creatorcontrib>Cho, Jeong Ho</creatorcontrib><creatorcontrib>Chang, Suk Tai</creatorcontrib><collection>Istex</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Advanced materials (Weinheim)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Nam Hee</au><au>Kim, Beom Jun</au><au>Ko, Yeongun</au><au>Cho, Jeong Ho</au><au>Chang, Suk Tai</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface Energy Engineered, High-Resolution Micropatterning of Solution-Processed Reduced Graphene Oxide Thin Films</atitle><jtitle>Advanced materials (Weinheim)</jtitle><addtitle>Adv. Mater</addtitle><date>2013-02-13</date><risdate>2013</risdate><volume>25</volume><issue>6</issue><spage>894</spage><epage>898</epage><pages>894-898</pages><issn>0935-9648</issn><eissn>1521-4095</eissn><abstract>Fast and reproducible patterning of high‐resolution rGO microstructures over a large area directly on various substrates by modulating the surface energy is reported. The pattern formation of rGO thin films is based on the difference in the adhesion strength between the mold/rGO and rGO/substrates interfaces. Such highly defined rGO micropatterns are applied as electrodes for high‐performance flexible and transparent OFETs.</abstract><cop>Weinheim</cop><pub>WILEY-VCH Verlag</pub><pmid>23125113</pmid><doi>10.1002/adma.201203881</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0935-9648 |
ispartof | Advanced materials (Weinheim), 2013-02, Vol.25 (6), p.894-898 |
issn | 0935-9648 1521-4095 |
language | eng |
recordid | cdi_proquest_miscellaneous_1439767720 |
source | Wiley:Jisc Collections:Wiley Read and Publish Open Access 2024-2025 (reading list) |
subjects | Adhesive strength Electrodes Graphene Graphite - chemistry micropatterning Molds OFETs Oxides Oxides - chemistry Patterning reduced graphene oxide Semiconductors Solutions - chemistry Surface energy Thermodynamics Thin films work of adhesion |
title | Surface Energy Engineered, High-Resolution Micropatterning of Solution-Processed Reduced Graphene Oxide Thin Films |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T10%3A00%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20Energy%20Engineered,%20High-Resolution%20Micropatterning%20of%20Solution-Processed%20Reduced%20Graphene%20Oxide%20Thin%20Films&rft.jtitle=Advanced%20materials%20(Weinheim)&rft.au=Kim,%20Nam%20Hee&rft.date=2013-02-13&rft.volume=25&rft.issue=6&rft.spage=894&rft.epage=898&rft.pages=894-898&rft.issn=0935-9648&rft.eissn=1521-4095&rft_id=info:doi/10.1002/adma.201203881&rft_dat=%3Cproquest_cross%3E1285462392%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c4561-b44185f8e6f99f7e31d8ca4dd4f72ad1a1c439ac15a570361904cbac50d5faa33%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1285462392&rft_id=info:pmid/23125113&rfr_iscdi=true |