Characterization of Nanocrystalline Yttria-Stabilized Zirconia : An In Situ HTXRD Study

Nanocrystalline yttria-stabilized zirconia powders, synthesized by the citrate nitrate gel combustion route, with yttria concentration varying from 8 to 12 mol% were studied by in situ high temperature X-ray diffraction in the temperature range of 25–1000°C. The sample obtained has a high specific s...

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Bibliographic Details
Published in:ISRN nanotechnology 2011-01, Vol.2011 (2011), p.1-4
Main Authors: Biswas, Mridula, Kumbhar, Chandrashekhar S., Gowtam, D. S.
Format: Article
Language:English
Subjects:
Acids
Combustion
Crystallites
Diffraction
Electrodes
Electrolytes
Fuel cells
Grain growth
High temperature
Laboratories
Materials research
Mathematical analysis
Metallurgy
Nanocrystals
Radiation
Solid solutions
Surface area
Thermal cycling
X-rays
Yttria stabilized zirconia
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Summary:Nanocrystalline yttria-stabilized zirconia powders, synthesized by the citrate nitrate gel combustion route, with yttria concentration varying from 8 to 12 mol% were studied by in situ high temperature X-ray diffraction in the temperature range of 25–1000°C. The sample obtained has a high specific surface area of 35 m2/g while calculated surface area was around 123 m2/g. The in situ high temperature X-ray diffraction study revealed that crystallite size remains in the range of 7–9 nm up to 800°C and then rapidly grows up to 21–23 nm upto 1000°C; only holding the material at 1000°C for 30 minutes can promote grain growth in the range of 42–49 nm. Coefficient of thermal expansion ranges from 9.65 to 9.03 ppm/°C for 8–12 mol% nanocrystalline yttria-stabilized zirconia.
ISSN:2090-6064
2090-6072
DOI:10.5402/2011/305687