Universal single board tester for investigation of the avalanche photo detectors

New electronic single board tester described here allows us to test and compare basic characteristics of new types of the avalanche photo diode (APD) (SiPMD, MCAPD, GAPD). It can measure the static and dynamic characteristics of the APD. We applied virtual periphery concept for very fast and simple...

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Published in:Journal of instrumentation 2012-01, Vol.7 (1), p.C01084-C01084
Main Authors: Kushpil, V, Kushpil, S
Format: Article
Language:English
Subjects:
Avalanche diodes
Data processing
Diodes
Electronics
Equivalent circuits
Instrumentation
Monitoring
Simulation
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Kushpil, S
description New electronic single board tester described here allows us to test and compare basic characteristics of new types of the avalanche photo diode (APD) (SiPMD, MCAPD, GAPD). It can measure the static and dynamic characteristics of the APD. We applied virtual periphery concept for very fast and simple way to measure the S/N resolution and own noise of the APD under investigation. The tester helps to define the main parameters of equivalent circuit of APD and using them for simulation. The tester can be useful for long time monitoring. New method for data analysis is suggested here.
doi_str_mv 10.1088/1748-0221/7/01/C01084
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source Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)
subjects Avalanche diodes
Data processing
Diodes
Electronics
Equivalent circuits
Instrumentation
Monitoring
Simulation
title Universal single board tester for investigation of the avalanche photo detectors
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