Dielectric probe for scattering-type terahertz scanning near-field optical microscopy

Dielectric material was used as the probe material for a scattering-type terahertz scanning near-field optical microscope (THz S-SNOM). It was found that the dielectric probe exhibits a strong near-field scattering signal with an amplitude comparable to that of the metallic probe. The behavior of th...

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Bibliographic Details
Published in:Applied physics letters 2013-10, Vol.103 (15)
Main Authors: Kurihara, T., Yamaguchi, K., Watanabe, H., Nakajima, M., Suemoto, T.
Format: Article
Language:English
Subjects:
Dielectric strength
Dielectrics
Expansion
Finite difference method
Mathematical analysis
Optical microscopes
Scanning
Temporal logic
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Summary:Dielectric material was used as the probe material for a scattering-type terahertz scanning near-field optical microscope (THz S-SNOM). It was found that the dielectric probe exhibits a strong near-field scattering signal with an amplitude comparable to that of the metallic probe. The behavior of the electric near-field around the tip was calculated using the finite-difference time-domain method, showing the field enhancement comparable to that of the metallic probe. The dielectric probe also exhibited a faster temporal response compared to the response of the metallic probe. Introduction of a non-metallic probe would enlarge the application field of the THz S-SNOM technique.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4824496