Dielectric probe for scattering-type terahertz scanning near-field optical microscopy

Dielectric material was used as the probe material for a scattering-type terahertz scanning near-field optical microscope (THz S-SNOM). It was found that the dielectric probe exhibits a strong near-field scattering signal with an amplitude comparable to that of the metallic probe. The behavior of th...

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Published in:Applied physics letters 2013-10, Vol.103 (15)
Main Authors: Kurihara, T., Yamaguchi, K., Watanabe, H., Nakajima, M., Suemoto, T.
Format: Article
Language:English
Subjects:
Dielectric strength
Dielectrics
Expansion
Finite difference method
Mathematical analysis
Optical microscopes
Scanning
Temporal logic
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cited_by cdi_FETCH-LOGICAL-c328t-5845deeb1df135c43edfb2ffdc02405c6dcd707654ff395aa450bf596b2c03533
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creator Kurihara, T.
Yamaguchi, K.
Watanabe, H.
Nakajima, M.
Suemoto, T.
description Dielectric material was used as the probe material for a scattering-type terahertz scanning near-field optical microscope (THz S-SNOM). It was found that the dielectric probe exhibits a strong near-field scattering signal with an amplitude comparable to that of the metallic probe. The behavior of the electric near-field around the tip was calculated using the finite-difference time-domain method, showing the field enhancement comparable to that of the metallic probe. The dielectric probe also exhibited a faster temporal response compared to the response of the metallic probe. Introduction of a non-metallic probe would enlarge the application field of the THz S-SNOM technique.
doi_str_mv 10.1063/1.4824496
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source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP_美国物理联合会现刊（与NSTL共建）
subjects Dielectric strength
Dielectrics
Expansion
Finite difference method
Mathematical analysis
Optical microscopes
Scanning
Temporal logic
title Dielectric probe for scattering-type terahertz scanning near-field optical microscopy
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