Microstructural Characterization of Large Area C sub(60) Films Obtained by Conventional Microwave Oven Irradiation

In the present work the synthesis of C sub(60) produced in a conventional microwave oven from the decomposition of camphor resin is reported. The polycrystalline structure of the sample was determined by X-Ray Diffraction (XRD), the sample showed several phases, the main phase corresponds to fullere...

Full description

Saved in:
Bibliographic Details
Published in:World journal of nano science and engineering 2012-12, Vol.2 (4), p.213-218
Main Authors: Martinez-Reyes, Jacobo, Barriga-Arceo, Lucia Graciela Diaz, Rendon-Vazquez, Luis, Martinez-Guerrero, Reynaldo, Romero-Partida, Nestor, Palacios-Gonzalez, Eduardo, Garibay-Febles, Vicente, Ortiz-Lopez, Jaime
Format: Article
Language:English
Subjects:
Buckminsterfullerene
Carbon
Fullerenes
Microwaves
Nanostructure
Ovens
Phases
Scanning electron microscopy
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In the present work the synthesis of C sub(60) produced in a conventional microwave oven from the decomposition of camphor resin is reported. The polycrystalline structure of the sample was determined by X-Ray Diffraction (XRD), the sample showed several phases, the main phase corresponds to fullerene C sub(60) ordered in a Face-Centered Cubic structure (FCC), with two more structures: one orthorhombic system and the other the monoclinic system coexisting also with graphite 2H phase. It was observed in a Scanning Electron Microscopy (SEM), that the sample formed thin films of stacked carbon. Whereas in a High Resolution Transmission Electron Microscopy (HRTEM), measurements in Bright Field mode revealed that the main phase of the material is C sub(60) ordered in FCC structure and the elemental composition and atomic bonding state can be determined by analyzing the energy with the electron microscope by Elesctron Energy- Loss Spectroscopy (EELS), technique allowed confirm all the phase C sub(60) established with XRD observations.
ISSN:2161-4954
2161-4962
DOI:10.4236/wjnse.2012.24029