Determination of Optimum Film Thickness and Composition of Cu(InAl)Se sub(2) Thin Films as an Absorber for Solar Cell Applications

Cu(InAl)Se2 [CIAS] thin films have been prepared by chemical bath deposition [CBD] technique. X-ray diffraction [XRD] and Energy dispersive X-ray analysis [EDAX] spectra have been employed to confirm the structure and composition of the prepared films. The structural parameters have been estimated f...

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Bibliographic Details
Published in:World journal of nano science and engineering 2011-12, Vol.1 (4), p.108-118
Main Authors: Kavitha, Balakrishnan, Dhanam, Muthusamy
Format: Article
Language:English
Subjects:
Film thickness
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Summary:Cu(InAl)Se2 [CIAS] thin films have been prepared by chemical bath deposition [CBD] technique. X-ray diffraction [XRD] and Energy dispersive X-ray analysis [EDAX] spectra have been employed to confirm the structure and composition of the prepared films. The structural parameters have been estimated from XRD and EDAX spectra and their variation with film thickness and composition has been discussed in this paper in detail. From the discussion we enabled to find the optimum film thickness and composition of CIAS thin films for solar cell applications.
ISSN:2161-4954
2161-4962
DOI:10.4236/wjnse.2011.14017