Loading…

The role and effect of residual stress on pore generation during anodization of aluminium thin films

•Al films of varying residual stress were prepared by sputtering.•Variation of the residual stress in the Al films influences pore growth during anodization.•The change in average pore size with residual stress is fairly small.•Interaction of residual stress with oxide growth stress leads to change...

Full description

Saved in:
Bibliographic Details
Published in:Corrosion science 2013-09, Vol.74, p.232-239
Main Authors: Liao, M.W., Chung, C.K.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c369t-85c5bbbe4b85f6db5157195328bec54ba988fb613ff4bd33548874a9c83045f3
cites cdi_FETCH-LOGICAL-c369t-85c5bbbe4b85f6db5157195328bec54ba988fb613ff4bd33548874a9c83045f3
container_end_page 239
container_issue
container_start_page 232
container_title Corrosion science
container_volume 74
creator Liao, M.W.
Chung, C.K.
description •Al films of varying residual stress were prepared by sputtering.•Variation of the residual stress in the Al films influences pore growth during anodization.•The change in average pore size with residual stress is fairly small.•Interaction of residual stress with oxide growth stress leads to change in structure.•Residual tensile stress increases the pore density of porous alumina. The role and effect of residual stress on pore generation of anodized aluminium oxide (AAO) have been investigated into anodizing the various-residual-stresses aluminium films. The plane stresses were characterised by X-ray diffraction with sin2ψ method. The pore density roughly linearly increased with residual stress from 64.6 (−132.5MPa) to 90.5pores/μm2 (135.9MPa). However, the average pore size around 40nm was not changed significantly except for the rougher film. The tensile residual stress lessened the compressive oxide growth stress to reduce AAO plastic deformation for higher pore density. The findings provide new foundations for realizing AAO films on silicon.
doi_str_mv 10.1016/j.corsci.2013.04.047
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1494336017</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0010938X13001820</els_id><sourcerecordid>1494336017</sourcerecordid><originalsourceid>FETCH-LOGICAL-c369t-85c5bbbe4b85f6db5157195328bec54ba988fb613ff4bd33548874a9c83045f3</originalsourceid><addsrcrecordid>eNp9kE1rGzEQhkVIIU7af5CDLoVc1pUsaVd7KRSTtAVDLz70JvQxsmV2JVfaDbS_PjJrciwMSCOedwY9CD1SsqaEtl9Oa5tysWG9IZStCa_V3aAVlV3fEN63t2hFCCVNz-TvO3RfyokQUlmyQm5_BJzTAFhHh8F7sBNOHmcowc16wGWq14JTxOeUAR8gQtZTqL2bc4iHmksu_FuealAP8xhimEc8HUPEPgxj-Yg-eD0U-HQ9H9D-5Xm__dHsfn3_uf22ayxr-6mRwgpjDHAjhW-dEVR0tBdsIw1YwY3upfSmpcx7bhxjgkvZcd1byQgXnj2gp2XsOac_M5RJjaFYGAYdIc1FUd5zxlpCu4ryBbU5lZLBq3MOo85_FSXq4lSd1OJUXZwqwmtdYp-vG3SxevBZRxvKe3bTiep5wyr3deGg_vY1QFZ1EkQLLuQqWLkU_r_oDX25j9Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1494336017</pqid></control><display><type>article</type><title>The role and effect of residual stress on pore generation during anodization of aluminium thin films</title><source>ScienceDirect Freedom Collection 2022-2024</source><creator>Liao, M.W. ; Chung, C.K.</creator><creatorcontrib>Liao, M.W. ; Chung, C.K.</creatorcontrib><description>•Al films of varying residual stress were prepared by sputtering.•Variation of the residual stress in the Al films influences pore growth during anodization.•The change in average pore size with residual stress is fairly small.•Interaction of residual stress with oxide growth stress leads to change in structure.•Residual tensile stress increases the pore density of porous alumina. The role and effect of residual stress on pore generation of anodized aluminium oxide (AAO) have been investigated into anodizing the various-residual-stresses aluminium films. The plane stresses were characterised by X-ray diffraction with sin2ψ method. The pore density roughly linearly increased with residual stress from 64.6 (−132.5MPa) to 90.5pores/μm2 (135.9MPa). However, the average pore size around 40nm was not changed significantly except for the rougher film. The tensile residual stress lessened the compressive oxide growth stress to reduce AAO plastic deformation for higher pore density. The findings provide new foundations for realizing AAO films on silicon.</description><identifier>ISSN: 0010-938X</identifier><identifier>EISSN: 1879-0496</identifier><identifier>DOI: 10.1016/j.corsci.2013.04.047</identifier><identifier>CODEN: CRRSAA</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>A. Aluminium ; Aluminium ; Aluminum ; Anodizing ; Applied sciences ; B. SEM ; B. X-ray diffraction ; C. Anodic films ; C. Oxidation ; Compressive properties ; Corrosion ; Corrosion environments ; Density ; Exact sciences and technology ; Metals. Metallurgy ; Plastic deformation ; Porosity ; Residual stress ; Thin films</subject><ispartof>Corrosion science, 2013-09, Vol.74, p.232-239</ispartof><rights>2013 Elsevier Ltd</rights><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-85c5bbbe4b85f6db5157195328bec54ba988fb613ff4bd33548874a9c83045f3</citedby><cites>FETCH-LOGICAL-c369t-85c5bbbe4b85f6db5157195328bec54ba988fb613ff4bd33548874a9c83045f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=27500123$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Liao, M.W.</creatorcontrib><creatorcontrib>Chung, C.K.</creatorcontrib><title>The role and effect of residual stress on pore generation during anodization of aluminium thin films</title><title>Corrosion science</title><description>•Al films of varying residual stress were prepared by sputtering.•Variation of the residual stress in the Al films influences pore growth during anodization.•The change in average pore size with residual stress is fairly small.•Interaction of residual stress with oxide growth stress leads to change in structure.•Residual tensile stress increases the pore density of porous alumina. The role and effect of residual stress on pore generation of anodized aluminium oxide (AAO) have been investigated into anodizing the various-residual-stresses aluminium films. The plane stresses were characterised by X-ray diffraction with sin2ψ method. The pore density roughly linearly increased with residual stress from 64.6 (−132.5MPa) to 90.5pores/μm2 (135.9MPa). However, the average pore size around 40nm was not changed significantly except for the rougher film. The tensile residual stress lessened the compressive oxide growth stress to reduce AAO plastic deformation for higher pore density. The findings provide new foundations for realizing AAO films on silicon.</description><subject>A. Aluminium</subject><subject>Aluminium</subject><subject>Aluminum</subject><subject>Anodizing</subject><subject>Applied sciences</subject><subject>B. SEM</subject><subject>B. X-ray diffraction</subject><subject>C. Anodic films</subject><subject>C. Oxidation</subject><subject>Compressive properties</subject><subject>Corrosion</subject><subject>Corrosion environments</subject><subject>Density</subject><subject>Exact sciences and technology</subject><subject>Metals. Metallurgy</subject><subject>Plastic deformation</subject><subject>Porosity</subject><subject>Residual stress</subject><subject>Thin films</subject><issn>0010-938X</issn><issn>1879-0496</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNp9kE1rGzEQhkVIIU7af5CDLoVc1pUsaVd7KRSTtAVDLz70JvQxsmV2JVfaDbS_PjJrciwMSCOedwY9CD1SsqaEtl9Oa5tysWG9IZStCa_V3aAVlV3fEN63t2hFCCVNz-TvO3RfyokQUlmyQm5_BJzTAFhHh8F7sBNOHmcowc16wGWq14JTxOeUAR8gQtZTqL2bc4iHmksu_FuealAP8xhimEc8HUPEPgxj-Yg-eD0U-HQ9H9D-5Xm__dHsfn3_uf22ayxr-6mRwgpjDHAjhW-dEVR0tBdsIw1YwY3upfSmpcx7bhxjgkvZcd1byQgXnj2gp2XsOac_M5RJjaFYGAYdIc1FUd5zxlpCu4ryBbU5lZLBq3MOo85_FSXq4lSd1OJUXZwqwmtdYp-vG3SxevBZRxvKe3bTiep5wyr3deGg_vY1QFZ1EkQLLuQqWLkU_r_oDX25j9Q</recordid><startdate>20130901</startdate><enddate>20130901</enddate><creator>Liao, M.W.</creator><creator>Chung, C.K.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7SE</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20130901</creationdate><title>The role and effect of residual stress on pore generation during anodization of aluminium thin films</title><author>Liao, M.W. ; Chung, C.K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-85c5bbbe4b85f6db5157195328bec54ba988fb613ff4bd33548874a9c83045f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>A. Aluminium</topic><topic>Aluminium</topic><topic>Aluminum</topic><topic>Anodizing</topic><topic>Applied sciences</topic><topic>B. SEM</topic><topic>B. X-ray diffraction</topic><topic>C. Anodic films</topic><topic>C. Oxidation</topic><topic>Compressive properties</topic><topic>Corrosion</topic><topic>Corrosion environments</topic><topic>Density</topic><topic>Exact sciences and technology</topic><topic>Metals. Metallurgy</topic><topic>Plastic deformation</topic><topic>Porosity</topic><topic>Residual stress</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liao, M.W.</creatorcontrib><creatorcontrib>Chung, C.K.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Corrosion science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liao, M.W.</au><au>Chung, C.K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The role and effect of residual stress on pore generation during anodization of aluminium thin films</atitle><jtitle>Corrosion science</jtitle><date>2013-09-01</date><risdate>2013</risdate><volume>74</volume><spage>232</spage><epage>239</epage><pages>232-239</pages><issn>0010-938X</issn><eissn>1879-0496</eissn><coden>CRRSAA</coden><abstract>•Al films of varying residual stress were prepared by sputtering.•Variation of the residual stress in the Al films influences pore growth during anodization.•The change in average pore size with residual stress is fairly small.•Interaction of residual stress with oxide growth stress leads to change in structure.•Residual tensile stress increases the pore density of porous alumina. The role and effect of residual stress on pore generation of anodized aluminium oxide (AAO) have been investigated into anodizing the various-residual-stresses aluminium films. The plane stresses were characterised by X-ray diffraction with sin2ψ method. The pore density roughly linearly increased with residual stress from 64.6 (−132.5MPa) to 90.5pores/μm2 (135.9MPa). However, the average pore size around 40nm was not changed significantly except for the rougher film. The tensile residual stress lessened the compressive oxide growth stress to reduce AAO plastic deformation for higher pore density. The findings provide new foundations for realizing AAO films on silicon.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.corsci.2013.04.047</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0010-938X
ispartof Corrosion science, 2013-09, Vol.74, p.232-239
issn 0010-938X
1879-0496
language eng
recordid cdi_proquest_miscellaneous_1494336017
source ScienceDirect Freedom Collection 2022-2024
subjects A. Aluminium
Aluminium
Aluminum
Anodizing
Applied sciences
B. SEM
B. X-ray diffraction
C. Anodic films
C. Oxidation
Compressive properties
Corrosion
Corrosion environments
Density
Exact sciences and technology
Metals. Metallurgy
Plastic deformation
Porosity
Residual stress
Thin films
title The role and effect of residual stress on pore generation during anodization of aluminium thin films
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T09%3A28%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20role%20and%20effect%20of%20residual%20stress%20on%20pore%20generation%20during%20anodization%20of%20aluminium%20thin%20films&rft.jtitle=Corrosion%20science&rft.au=Liao,%20M.W.&rft.date=2013-09-01&rft.volume=74&rft.spage=232&rft.epage=239&rft.pages=232-239&rft.issn=0010-938X&rft.eissn=1879-0496&rft.coden=CRRSAA&rft_id=info:doi/10.1016/j.corsci.2013.04.047&rft_dat=%3Cproquest_cross%3E1494336017%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c369t-85c5bbbe4b85f6db5157195328bec54ba988fb613ff4bd33548874a9c83045f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1494336017&rft_id=info:pmid/&rfr_iscdi=true