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Mie resonance-enhanced light absorption in periodic silicon nanopillar arrays

Mie-resonances in vertical, small aspect-ratio and subwavelength silicon nanopillars are investigated using visible bright-field µ-reflection measurements and Raman scattering. Pillar-to-pillar interactions were examined by comparing randomly to periodically arranged arrays with systematic variation...

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Bibliographic Details
Published in:Optics express 2013-11, Vol.21 (23), p.27587-27601
Main Authors: Bezares, Francisco J, Long, James P, Glembocki, Orest J, Guo, Junpeng, Rendell, Ronald W, Kasica, Richard, Shirey, Loretta, Owrutsky, Jeffrey C, Caldwell, Joshua D
Format: Article
Language:English
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Summary:Mie-resonances in vertical, small aspect-ratio and subwavelength silicon nanopillars are investigated using visible bright-field µ-reflection measurements and Raman scattering. Pillar-to-pillar interactions were examined by comparing randomly to periodically arranged arrays with systematic variations in nanopillar diameter and array pitch. First- and second-order Mie resonances are observed in reflectance spectra as pronounced dips with minimum reflectances of several percent, suggesting an alternative approach to fabricating a perfect absorber. The resonant wavelengths shift approximately linearly with nanopillar diameter, which enables a simple empirical description of the resonance condition. In addition, resonances are also significantly affected by array density, with an overall oscillating blue shift as the pitch is reduced. Finite-element method and finite-difference time-domain simulations agree closely with experimental results and provide valuable insight into the nature of the dielectric resonance modes, including a surprisingly small influence of the substrate on resonance wavelength. To probe local fields within the Si nanopillars, µ-Raman scattering measurements were also conducted that confirm enhanced optical fields in the pillars when excited on-resonance.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.21.027587