Hole injection and electron overflow improvement in InGaN/GaN light-emitting diodes by a tapered AlGaN electron blocking layer

A tapered AlGaN electron blocking layer with step-graded aluminum composition is analyzed in nitride-based blue light-emitting diode (LED) numerically and experimentally. The energy band diagrams, electrostatic fields, carrier concentration, electron current density profiles, and hole transmitting p...

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Bibliographic Details
Published in:Optics express 2014-01, Vol.22 (1), p.463-469
Main Authors: Lin, Bing-Chen, Chen, Kuo-Ju, Wang, Chao-Hsun, Chiu, Ching-Hsueh, Lan, Yu-Pin, Lin, Chien-Chung, Lee, Po-Tsung, Shih, Min-Hsiung, Kuo, Yen-Kuang, Kuo, Hao-Chung
Format: Article
Language:English
Subjects:
Aluminum Compounds - chemistry
Electron Transport
Equipment Design
Equipment Failure Analysis
Gallium - chemistry
Indium - chemistry
Lighting - instrumentation
Materials Testing
Semiconductors
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Summary:A tapered AlGaN electron blocking layer with step-graded aluminum composition is analyzed in nitride-based blue light-emitting diode (LED) numerically and experimentally. The energy band diagrams, electrostatic fields, carrier concentration, electron current density profiles, and hole transmitting probability are investigated. The simulation results demonstrated that such tapered structure can effectively enhance the hole injection efficiency as well as the electron confinement. Consequently, the LED with a tapered EBL grown by metal-organic chemical vapor deposition exhibits reduced efficiency droop behavior of 29% as compared with 44% for original LED, which reflects the improvement in hole injection and electron overflow in our design.
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.22.000463