In Situ Monitoring of Thermal Crystallization of Ultrathin Tris(8-Hydroxyquinoline) Aluminum Films Using Surface-Enhanced Raman Scattering

Thermal crystallization of 3, 10, and 60 nm-thick tris(8-hydroxyquinoline)aluminum (Alq3) films is studied using surface-enhanced Raman scattering with a constant heating rate. An abrupt higher frequency shift of the quinoline-stretching mode is found to be an indication of a phase transition of Alq...

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Bibliographic Details
Published in:Applied spectroscopy 2014-01, Vol.68 (1), p.39-43
Main Author: Muraki, Naoki
Format: Article
Language:English
Subjects:
Aluminum
Crystal structure
Crystallization
Frequency shift
Heating rate
Monitoring
Raman scattering
Solvents
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Summary:Thermal crystallization of 3, 10, and 60 nm-thick tris(8-hydroxyquinoline)aluminum (Alq3) films is studied using surface-enhanced Raman scattering with a constant heating rate. An abrupt higher frequency shift of the quinoline-stretching mode is found to be an indication of a phase transition of Alq3 molecules from amorphous to crystalline. While the 60 nm-thick film shows the same crystallization temperature as a bulk sample, the thinner films were found to have a lower crystallization temperature and slower rate of crystallization. Non-isothermal kinetics analysis is performed to quantify kinetic properties such as the Avrami exponent constants and crystallization rates of ultrathin Alq3 films.
ISSN:0003-7028
1943-3530
DOI:10.1366/13-07187