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Emission characteristics of single InGaN quantum wells on misoriented nonpolar m-plane bulk GaN substrates
InGaN single quantum wells (SQWs) grown on m-plane bulk GaN substrates show significant differences in peak emission wavelength when grown on substrates oriented nominally on-axis compared to substrates with small intentional misorientations (miscuts) towards the orthogonal −c-direction or a-directi...
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Published in: | Journal of crystal growth 2013-11, Vol.382, p.80-86 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | InGaN single quantum wells (SQWs) grown on m-plane bulk GaN substrates show significant differences in peak emission wavelength when grown on substrates oriented nominally on-axis compared to substrates with small intentional misorientations (miscuts) towards the orthogonal −c-direction or a-direction. SQWs on substrates intentionally miscut toward the a-direction emit longer wavelengths than those with miscuts towards the −c-direction in a variety of identical growth conditions, while SQWs on nominally on-axis m-plane with pyramidal hillocks features display emission characteristics of both. These preliminary co-loaded growth studies may provide insight into broad or anomalous wavelength emission observed on nonpolar GaN-based visible light emitters and suggest opportunities for improving LED and laser diode device performance on this naturally occurring crystal plane.
•We examine emission characteristics of InGaN quantum wells on misoriented m-plane substrates.•Blue quantum wells on on-axis m-plane substrates show broad and dual wavelength emission and non-uniform in incorporation.•Substrates misoriented in the c- or a-direction lead to smoother film morphologies and more uniform quantum well emission.•Substrates misoriented in the a-direction show much higher In incorporation than other m-plane substrate orientations and longer emission wavelengths. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2013.08.013 |