At-wavelength metrology of hard X-ray mirror using near field speckle

We present a method to measure the surface profile of hard X-ray reflective optics with nanometer height accuracy and sub-millimetre lateral resolution. The technique uses X-ray near-field speckle, generated by a scattering membrane translated using a piezo motor, to infer the deflection of X-rays f...

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Bibliographic Details
Published in:Optics express 2014-03, Vol.22 (6), p.6438-6446
Main Authors: Berujon, Sebastien, Wang, Hongchang, Alcock, Simon, Sawhney, Kawal
Format: Article
Language:English
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Summary:We present a method to measure the surface profile of hard X-ray reflective optics with nanometer height accuracy and sub-millimetre lateral resolution. The technique uses X-ray near-field speckle, generated by a scattering membrane translated using a piezo motor, to infer the deflection of X-rays from the surface. The method provides a nano-radian order accuracy on the mirror slopes in both the tangential and sagittal directions. As a demonstration, a pair of focusing mirrors mounted in a Kirkpatrick-Baez (KB) configuration were characterized and the results were in good agreement with offline metrology data. It is hoped that the new technique will provide feedback to optic manufacturers to improve mirror fabrication and be useful for the online optimization of active, nano-focusing mirrors on modern synchrotron beamlines.
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.22.006438