A simple sample treatment on insulating materials for X-ray photoelectron diffraction: C 1s XPD of diamond (001) single crystal

•X-ray photoelectron diffraction (XPD) is a fruit of advancement of X-ray photoelectron spectroscopy (XPS).•XPD is now a handy method for determining non-destructively the near-surface atomic structures.•Insulating materials, however, cause nuisance charging effects in XPS and XPD.•A simple method o...

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena 2013-08, Vol.189 (5-7), p.103-105
Main Authors: Kono, Shozo, Kodama, Hideyuki, Ichikawa, Kimiyoshi, Yoshikawa, Taro, Sawabe, Atsuhito
Format: Article
Language:English
Subjects:
Charging
Diamond
Diamonds
Diffraction
Electron spectroscopy
Insulating material
Insulating materials
Photoelectrons
Single crystals
X-ray photoelectron diffraction
X-rays
XPS
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Summary:•X-ray photoelectron diffraction (XPD) is a fruit of advancement of X-ray photoelectron spectroscopy (XPS).•XPD is now a handy method for determining non-destructively the near-surface atomic structures.•Insulating materials, however, cause nuisance charging effects in XPS and XPD.•A simple method of sample treatment for angle-scan XPD for insulating diamond is demonstrated.•This simple method may be applied in principle to any insulating material. A simple method of sample treatment for angle-scan X-ray photoelectron diffraction (XPD) for insulating diamond is demonstrated. The resulting XPD patterns have shown that a quantitative measure of near-surface atomic order is obtained for the insulating diamond. This simple method may be applied in principle to any insulating material, which enables non-destructive characterization of near-surface order of insulating materials by XPD.
ISSN:0368-2048
1873-2526
DOI:10.1016/j.elspec.2013.08.004