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Analysis of photocurrent responses of oxide films formed on stainless steel
The photocurrent responses of the oxide films formed on 304L stainless steel in high temperature and high pressure water was investigated in borate buffer solutions. The photocurrent responses showed transient characteristics. The oxide films exhibited a p-type semiconductor but presented negative s...
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Published in: | Electrochimica acta 2013-02, Vol.89, p.253-261 |
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creator | Zhang, Shenghan Jia, Lian Yu, Tan |
description | The photocurrent responses of the oxide films formed on 304L stainless steel in high temperature and high pressure water was investigated in borate buffer solutions. The photocurrent responses showed transient characteristics. The oxide films exhibited a p-type semiconductor but presented negative steady photocurrents and positive photocurrent spikes under certain applied bias and incident light. A theoretical model was developed to analyze the transient photocurrent behaviors. This model was derived on the basis of continuity equation for carriers and can give a reasonable explanation for the transient photocurrent waveform patterns. The transient photocurrent waveform pattern is mainly dependent on the electric field inside the space charge region of the outer layer at oxide film/electrolyte interface. The effects of applied bias and incident light on photocurrent waveform patterns result from their impacts on the electric field. The values of calculated electric field by fitting the measured photocurrent data show a good agreement with the prediction of the model. |
doi_str_mv | 10.1016/j.electacta.2012.10.167 |
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The photocurrent responses showed transient characteristics. The oxide films exhibited a p-type semiconductor but presented negative steady photocurrents and positive photocurrent spikes under certain applied bias and incident light. A theoretical model was developed to analyze the transient photocurrent behaviors. This model was derived on the basis of continuity equation for carriers and can give a reasonable explanation for the transient photocurrent waveform patterns. The transient photocurrent waveform pattern is mainly dependent on the electric field inside the space charge region of the outer layer at oxide film/electrolyte interface. The effects of applied bias and incident light on photocurrent waveform patterns result from their impacts on the electric field. The values of calculated electric field by fitting the measured photocurrent data show a good agreement with the prediction of the model.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/j.electacta.2012.10.167</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Austenitic stainless steels ; Bias ; Carrier density ; Continuity equation ; Electric fields ; Mathematical models ; Oxide coatings ; Oxide films ; Photocurrent ; Photocurrent response ; Photoelectric effect ; Semiconductor ; Stainless steels ; Waveforms</subject><ispartof>Electrochimica acta, 2013-02, Vol.89, p.253-261</ispartof><rights>2012 Elsevier Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c381t-5bae2814c9c37caa4fe2f0304482d110cc868d6c9577b25d64e53ea6663b8aef3</citedby><cites>FETCH-LOGICAL-c381t-5bae2814c9c37caa4fe2f0304482d110cc868d6c9577b25d64e53ea6663b8aef3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Zhang, Shenghan</creatorcontrib><creatorcontrib>Jia, Lian</creatorcontrib><creatorcontrib>Yu, Tan</creatorcontrib><title>Analysis of photocurrent responses of oxide films formed on stainless steel</title><title>Electrochimica acta</title><description>The photocurrent responses of the oxide films formed on 304L stainless steel in high temperature and high pressure water was investigated in borate buffer solutions. The photocurrent responses showed transient characteristics. The oxide films exhibited a p-type semiconductor but presented negative steady photocurrents and positive photocurrent spikes under certain applied bias and incident light. A theoretical model was developed to analyze the transient photocurrent behaviors. This model was derived on the basis of continuity equation for carriers and can give a reasonable explanation for the transient photocurrent waveform patterns. The transient photocurrent waveform pattern is mainly dependent on the electric field inside the space charge region of the outer layer at oxide film/electrolyte interface. The effects of applied bias and incident light on photocurrent waveform patterns result from their impacts on the electric field. The values of calculated electric field by fitting the measured photocurrent data show a good agreement with the prediction of the model.</description><subject>Austenitic stainless steels</subject><subject>Bias</subject><subject>Carrier density</subject><subject>Continuity equation</subject><subject>Electric fields</subject><subject>Mathematical models</subject><subject>Oxide coatings</subject><subject>Oxide films</subject><subject>Photocurrent</subject><subject>Photocurrent response</subject><subject>Photoelectric effect</subject><subject>Semiconductor</subject><subject>Stainless steels</subject><subject>Waveforms</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkM1Lw0AQxRdRsFb_BnP0kribzX7kWIpfWPCi52W7meCWTTbupGL_e9NWvBYGZuD93oN5hNwyWjDK5P2mgAButNMUJWVlsRekOiMzphXPuRb1OZlRynheSS0vyRXihlKqpKIz8rrobdihxyy22fAZx-i2KUE_ZglwiD3CQYk_voGs9aHDrI2pgyaLfYaj9X0AxOkCCNfkorUB4eZvz8nH48P78jlfvT29LBer3HHNxlysLZSaVa52XDlrqxbKlnJaVbpsGKPOaakb6Wqh1LoUjaxAcLBSSr7WFlo-J3fH3CHFry3gaDqPDkKwPcQtGiYYr7SsK3ka5VIwVmshJlQdUZciYoLWDMl3Nu0Mo2bftNmY_6bNvumDINXkXBydMD397SEZdB56B41PE2-a6E9m_AIYIYvq</recordid><startdate>20130201</startdate><enddate>20130201</enddate><creator>Zhang, Shenghan</creator><creator>Jia, Lian</creator><creator>Yu, Tan</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20130201</creationdate><title>Analysis of photocurrent responses of oxide films formed on stainless steel</title><author>Zhang, Shenghan ; Jia, Lian ; Yu, Tan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c381t-5bae2814c9c37caa4fe2f0304482d110cc868d6c9577b25d64e53ea6663b8aef3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Austenitic stainless steels</topic><topic>Bias</topic><topic>Carrier density</topic><topic>Continuity equation</topic><topic>Electric fields</topic><topic>Mathematical models</topic><topic>Oxide coatings</topic><topic>Oxide films</topic><topic>Photocurrent</topic><topic>Photocurrent response</topic><topic>Photoelectric effect</topic><topic>Semiconductor</topic><topic>Stainless steels</topic><topic>Waveforms</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Shenghan</creatorcontrib><creatorcontrib>Jia, Lian</creatorcontrib><creatorcontrib>Yu, Tan</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Shenghan</au><au>Jia, Lian</au><au>Yu, Tan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of photocurrent responses of oxide films formed on stainless steel</atitle><jtitle>Electrochimica acta</jtitle><date>2013-02-01</date><risdate>2013</risdate><volume>89</volume><spage>253</spage><epage>261</epage><pages>253-261</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><abstract>The photocurrent responses of the oxide films formed on 304L stainless steel in high temperature and high pressure water was investigated in borate buffer solutions. The photocurrent responses showed transient characteristics. The oxide films exhibited a p-type semiconductor but presented negative steady photocurrents and positive photocurrent spikes under certain applied bias and incident light. A theoretical model was developed to analyze the transient photocurrent behaviors. This model was derived on the basis of continuity equation for carriers and can give a reasonable explanation for the transient photocurrent waveform patterns. The transient photocurrent waveform pattern is mainly dependent on the electric field inside the space charge region of the outer layer at oxide film/electrolyte interface. The effects of applied bias and incident light on photocurrent waveform patterns result from their impacts on the electric field. 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subjects | Austenitic stainless steels Bias Carrier density Continuity equation Electric fields Mathematical models Oxide coatings Oxide films Photocurrent Photocurrent response Photoelectric effect Semiconductor Stainless steels Waveforms |
title | Analysis of photocurrent responses of oxide films formed on stainless steel |
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