Cost Effective Test Methodology Using PMU for Automated Test Equipment Systems

In this article, test methodology using parametric measurement unit is proposed for Automated Test Equipment (ATE) systems, using 600MHz Driver, Comparator, and Active load (DCL). ATE systems is a very important means to reduce the device test cost, and the systems should be able to test several mod...

Full description

Saved in:
Bibliographic Details
Published in:International journal of VLSI design & communication systems 2014-02, Vol.5 (1), p.15-27
Main Authors: Jung, In-Seok, Kim, Yong-Bin, Ki Kim, Kyung
Format: Article
Language:English
Subjects:
Automated
Communication systems
Design engineering
Devices
High speed
Methodology
Specifications
Test equipment
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this article, test methodology using parametric measurement unit is proposed for Automated Test Equipment (ATE) systems, using 600MHz Driver, Comparator, and Active load (DCL). ATE systems is a very important means to reduce the device test cost, and the systems should be able to test several modes to check the performance characteristics of the device. The proposed methodology provides four different types of test operation for DC and AC analysis of the Device-Under-Test. Along with the proposed methodology, this article proposes ATE system integration methodology for cost effective ATE integration for high speed test. The measured test results using the proposed method and system turned out to be well within the target specifications with high accuracies.
ISSN:0976-1527
0976-1357
DOI:10.5121/vlsic.2014.5102