Analysis of beam test data by global optimization methods

Successful track reconstruction in a silicon tracking device depends on the quality of the alignment, on the knowledge of the sensor resolution, and on the knowledge of the amount of material traversed by the particles. We describe algorithms for the concurrent estimation of alignment parameters, se...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2013-12, Vol.732, p.79-82
Main Authors: Frühwirth, R., Bergauer, T., Friedl, M., Gjersdal, H., Irmler, C., Spielauer, T., Strandlie, A., Valentan, M.
Format: Article
Language:English
Subjects:
Accelerators
Algorithms
Alignment
Beams (radiation)
Computer simulation
Estimation of resolution
Material estimation
Optimization
Sensors
Track reconstruction
Tracking devices
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Summary:Successful track reconstruction in a silicon tracking device depends on the quality of the alignment, on the knowledge of the sensor resolution, and on the knowledge of the amount of material traversed by the particles. We describe algorithms for the concurrent estimation of alignment parameters, sensor resolutions and material thickness in the context of a beam test setup. They are based on a global optimization approach and are designed to work both with and without prior information from a reference telescope. We present results from simulated and real beam test data. •We describe a method to estimate the resolution of detectors in a beam test.•The method is based on the global optimization of a suitable objective function.•The width of individual components of the error distribution can be estimated.•Under suitable conditions, sensor thickness (and other material) can be estimated as well.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2013.05.038