Structural and optical properties of DC Sputtered Cd2SnO4 nanocrystalline films

• Published in: Journal of alloys and compounds 2014-02, Vol.585, p.1-6
• Main Authors: El-Nahass, M.M., Atta, A.A., Abd El-Raheem, M.M., Hassanien, A.M.
• Format: Article
• Language: English
• Subjects: Atomic force microscopy; Cd2SnO4; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Constants; DC Sputtered; Direct current; Dispersions; Exact sciences and technology; Nanocrystals and nanoparticles; Optical properties; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures; Optical transition; Physics; Refractive index; Refractivity
• ISSN: 0925-8388; 1873-4669
• DOI: 10.1016/j.jallcom.2013.09.079

•The structural and optical properties of DC Sputtered Cd2SnO4 thin Films have been studied.•X-ray diffraction and AFM have been used to identify the structure properties.•From fundamental absorption edge, a picture of the energetic transitions of was described.•A single-oscillator model and Drude model were used to describe the refractive index. The structural and optical properties of DC Sputtered Cd2SnO4 thin Films have been reported. The structure of the films was analyzed by X-ray diffraction and atomic force microscopy (AFM). The optical constants (refractive index, n, and absorption index, k) of the as-deposited films have been obtained in the wavelength range 300–1800nm by using spectrophotometric measurements at nearly normal incidence. The obtained absorption index, k, was used to estimate the type of optical transition for the as-deposited films. The single oscillator model and Drude model of free carriers’ absorption have been used for the analysis of refractive index dispersion, in the normal dispersion range.