The effect of encapsulant discoloration and delamination on the electrical characteristics of photovoltaic module

•Delamination and discoloration were investigated with 25-year-old module.•Delamination and discoloration result in the drop of short circuit current (Isc).•Corrosion occurred at the interconnection between cell metallization-Cu interconnection.•Delamination occurs at the interface cell and encapsul...

Full description

Saved in:
Bibliographic Details
Published in:Microelectronics and reliability 2013-09, Vol.53 (9-11), p.1818-1822
Main Authors: Park, N.C., Jeong, J.S., Kang, B.J., Kim, D.H.
Format: Article
Language:English
Subjects:
Applied sciences
Degradation
Delaminating
Delamination
Design. Technologies. Operation analysis. Testing
Discoloration
Electronics
Encapsulation
Energy
Exact sciences and technology
Integrated circuits
Modules
Natural energy
Optoelectronic devices
Photovoltaic cells
Photovoltaic conversion
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Solar cells
Solar cells. Photoelectrochemical cells
Solar energy
Testing, measurement, noise and reliability
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:•Delamination and discoloration were investigated with 25-year-old module.•Delamination and discoloration result in the drop of short circuit current (Isc).•Corrosion occurred at the interconnection between cell metallization-Cu interconnection.•Delamination occurs at the interface cell and encapsulant. Discoloration and delamination (D&D) of encapsulant in a photovoltaic (PV) module affect the electrical characteristics. Therefore, in this study D&D-induced degradations are investigated with a 25-year-old PV module. The average power output of 25-year-old PV modules decreased by 17.9% compared to initial value. However, insulation properties have been stable over 25years. Electroluminescence image shows that discoloration has an effect on the cell degradation. The effect of D&D on the light reflectance and transmittance is evaluated by performing a trapezoidal integration with the standard global reference spectrum. Failure analysis reveals that delamination occurs at the interface between encapsulant and solar cell and also shows that corrosion of solder occurred near delamination site
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2013.07.062