LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing

•This paper has presented an original study on the ageing impact to a LDO regulator.•The ageing leads to a general decrease of the DC characteristic.•The ageing leads to susceptibility increase to EMI conducted along the power supply.•CAD simulations analyses are proposed to explain the experimental...

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Bibliographic Details
Published in:Microelectronics and reliability 2013-09, Vol.53 (9-11), p.1273-1277
Main Authors: Wu, J., Boyer, A., Li, J., Bendhia, S., Vrignon, B.
Format: Article
Language:English
Subjects:
Aging
Analog circuits
Applied sciences
Circuit properties
Direct current
Electric potential
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Regulators
Signal convertors
Simulation
Stresses
Voltage
Voltage regulators
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Summary:•This paper has presented an original study on the ageing impact to a LDO regulator.•The ageing leads to a general decrease of the DC characteristic.•The ageing leads to susceptibility increase to EMI conducted along the power supply.•CAD simulations analyses are proposed to explain the experimental observations.•LDO performance reduction is activated by degradation mechanisms at transistor level. Analog circuits such as linear voltage regulators are crucial for electrical system operational stability. But they are very sensitive to electromagnetic interferences which induce voltage offset on their outputs. In harsh environments, the ageing of this component can be accelerated and could lead to twofold effects: decrease of the output voltage and increase of the effect of electromagnetic interferences. This paper proposes an original study about the drift of the DC characteristic and susceptibility level of a low dropout voltage regulator submitted to electrical stresses. Some analyses based on CAD simulations are proposed to explain the experimental observations.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2013.07.124