Preparation and Characterization of Graphene Oxide

Graphene oxide (GO) films with two-dimensional structure were successfully prepared via the modified Hummer method. It is proven that redox method is a promising way to synthesize GO films on a large scale. Comprehensive characterizations of the properties of GO films were conducted. TEM and DFM ana...

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Bibliographic Details
Published in:Journal of nanomaterials 2014-01, Vol.2014 (2014), p.1-6
Main Authors: Song, Jianguo, Chang, Chang Tang, Wang, Xinzhi
Format: Article
Language:English
Subjects:
Analyzers
Chemical vapor deposition
Graphene
Graphite
Lamellar structure
Nanomaterials
Oxides
Spectrometers
Spectrum analysis
Studies
Transmission electron microscopy
X-ray photoelectron spectroscopy
X-rays
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Summary:Graphene oxide (GO) films with two-dimensional structure were successfully prepared via the modified Hummer method. It is proven that redox method is a promising way to synthesize GO films on a large scale. Comprehensive characterizations of the properties of GO films were conducted. TEM and DFM analyses showed that GO sheets prepared in this study had single and double lamellar layer structure and a thickness of 2~3 nm. X-ray diffraction (XRD) was selected to measure the crystal structure of GO sheet. Fourier-transform infrared spectra analyzer (FT-IR) was used to certify the presence of oxygen-containing functional groups in GO films. The tests of UV-VIS spectrometer and TGA analyzer indicated that GO sheet possessed excellent optical response and outstanding thermal stability. Elemental analyzer (EA) and X-ray photoelectron spectroscope (XPS) analyzed the components synthetic material. Simultaneously, chemical structure of GO sheet was described in this study. Discussion and references for further research on graphene are provided.
ISSN:1687-4110
1687-4129
DOI:10.1155/2014/276143