Data analysis method to achieve sub-10 pm spatial resolution using extended X-ray absorption fine-structure spectroscopy

Obtaining sub‐10 pm spatial resolution by extended X‐ray absorption fine structure (EXAFS) spectroscopy is required in many important fields of research, such as lattice distortion studies in colossal magnetic resistance materials, high‐temperature superconductivity materials etc. However, based on...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2014-07, Vol.21 (4), p.756-761
Main Authors: Du, Yonghua, Wang, Jia-ou, Jiang, Longhua, Borgna, Lucas Santiago, Wang, Yanfei, Zheng, Yi, Hu, Tiandou
Format: Article
Language:English
Subjects:
atom distribution function
EXAFS
spatial resolution
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Summary:Obtaining sub‐10 pm spatial resolution by extended X‐ray absorption fine structure (EXAFS) spectroscopy is required in many important fields of research, such as lattice distortion studies in colossal magnetic resistance materials, high‐temperature superconductivity materials etc. However, based on the existing EXAFS data analysis methods, EXAFS has a spatial resolution limit of π/2Δk which is larger than 0.1 Å. In this paper a new data analysis method which can easily achieve sub‐10 pm resolution is introduced. Theoretically, the resolution limit of the method is three times better than that normally available. The method is examined by numerical simulation and experimental data. As a demonstration, the LaFe1–xCrxO3 system (x = 0, 1/3, 2/3) is studied and the structural information of FeO6 octahedral distortion as a function of Cr doping is resolved directly from EXAFS, where a resolution better than 0.074 Å is achieved.
ISSN:1600-5775
1600-5775
DOI:10.1107/S1600577514010406