Performance of ultra-thin SOI-based resonators for sensing applications

This work presents simulation and experimental results of ultra-thin optical ring resonators, having larger Evanescent Field (EF) penetration depths, and therefore larger sensitivities, as compared to conventional Silicon-on-Insulator (SOI)-based resonator sensors. Having higher sensitivities to the...

Full description

Saved in:
Bibliographic Details
Published in:Optics express 2014-06, Vol.22 (12), p.14166-14179
Main Authors: Fard, Sahba Talebi, Donzella, Valentina, Schmidt, Shon A, Flueckiger, Jonas, Grist, Samantha M, Talebi Fard, Pouria, Wu, Yichen, Bojko, Rick J, Kwok, Ezra, Jaeger, Nicolas A F, Ratner, Daniel M, Chrostowski, Lukas
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This work presents simulation and experimental results of ultra-thin optical ring resonators, having larger Evanescent Field (EF) penetration depths, and therefore larger sensitivities, as compared to conventional Silicon-on-Insulator (SOI)-based resonator sensors. Having higher sensitivities to the changes in the refractive indices of the cladding media is desirable for sensing applications, as the interactions of interest take place in this region. Using ultra-thin waveguides (
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.22.014166