Identification of primary and secondary filler structures in a polymer matrix by atomic force microscopy images analysis methods

Segmentation algorithms have been developed to study the surface of filled rubbers using atomic force microscopy (AFM) images. The analysis reveals two types of segments in the material: micropellets (large, dense inclusions of a insufficiently ground filler) and aggregates (small primary filler inc...

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Bibliographic Details
Published in:Polymer composites 2013-03, Vol.34 (3), p.433-442
Main Author: Morozov, I.A.
Format: Article
Language:English
Subjects:
Aggregates
Algorithms
Atomic force microscopy
Fillers
Fractal analysis
Inclusions
Rubber
Segmentation
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Summary:Segmentation algorithms have been developed to study the surface of filled rubbers using atomic force microscopy (AFM) images. The analysis reveals two types of segments in the material: micropellets (large, dense inclusions of a insufficiently ground filler) and aggregates (small primary filler inclusions). The proposed approach allows us to find the minimum size of a representative area, starting from the filler distribution can be treated as homogeneous (mesoscale). Secondary structures (clusters) created by aggregates are identified and their fractal parameters are calculated. The validity of the approach for the analysis of rubbers filled with carbon black is demonstrated. POLYM. COMPOS., 2013. © 2013 Society of Plastics Engineers
ISSN:0272-8397
1548-0569
DOI:10.1002/pc.22430