Retrieval of the atomic displacements in the crystal from the coherent X-ray diffraction pattern

The retrieval of spatially resolved atomic displacements is investigated via the phases of the direct(real)‐space image reconstructed from the strained crystal's coherent X‐ray diffraction pattern. It is demonstrated that limiting the spatial variation of the first‐ and second‐order spatial dis...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2014-07, Vol.21 (4), p.774-783
Main Authors: Minkevich, A. A., Köhl, M., Escoubas, S., Thomas, O., Baumbach, T.
Format: Article
Language:English
Subjects:
Arrays
Coherence
coherent X-ray diffraction imaging
Convergence
Crystals
Derivatives
Diffraction
Diffraction patterns
phase retrieval
Retrieval
strained crystal
X-rays
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Summary:The retrieval of spatially resolved atomic displacements is investigated via the phases of the direct(real)‐space image reconstructed from the strained crystal's coherent X‐ray diffraction pattern. It is demonstrated that limiting the spatial variation of the first‐ and second‐order spatial displacement derivatives improves convergence of the iterative phase‐retrieval algorithm for displacements reconstructions to the true solution. This approach is exploited to retrieve the displacement in a periodic array of silicon lines isolated by silicon dioxide filled trenches.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577514010108