Proton radiation damage effects on the response of high speed communication avalanche photodiodes (notice of removal)

Subsequent to its publication in Optical Engineering, SPIE learned that a significant portion of this paper was previously published as "Harmful Proton Radiation Damage and Induced Bit Error Effects on the Performance of Avalanche Photodiode Devices," in International Journal of Multidisci...

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Bibliographic Details
Published in:Optical engineering 2013-01, Vol.52 (1), p.014003-014003
Main Authors: Rashed, Ahmed Nabih Zaki, El-Halawany, Mohamed M. E
Format: Article
Language:English
Subjects:
Avalanches
Devices
Documents
Ethics
High speed
Multidisciplinary
Photodiodes
Radiation damage
Online Access:Get full text
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Summary:Subsequent to its publication in Optical Engineering, SPIE learned that a significant portion of this paper was previously published as "Harmful Proton Radiation Damage and Induced Bit Error Effects on the Performance of Avalanche Photodiode Devices," in International Journal of Multidisciplinary Sciences and Engineering, Vol. 2, No. 4 (July 2011). Double publication violates SPIE Code of Ethics and consequently the paper has been removed from Optical Engineering by the publisher.
ISSN:0091-3286
1560-2303
DOI:10.1117/1.OE.52.1.014003