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Wear tests of ZrC and ZrN thin films grown by pulsed laser deposition
•ZrC and ZrN films were grown by pulsed laser deposition on Si wafers at 500°C.•AES investigations results indicated that films contain less than 2% O in bulk.•Uniaxial reciprocating sliding tests found a friction coefficient of around 0.3 and a wear rate of only 4.5×10−6mm3/Nm for the ZrN films. Ve...
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Published in: | Applied surface science 2014-07, Vol.306, p.33-36 |
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creator | Dorcioman, G. Socol, G. Craciun, D. Argibay, N. Lambers, E. Hanna, M. Taylor, C.R. Craciun, V. |
description | •ZrC and ZrN films were grown by pulsed laser deposition on Si wafers at 500°C.•AES investigations results indicated that films contain less than 2% O in bulk.•Uniaxial reciprocating sliding tests found a friction coefficient of around 0.3 and a wear rate of only 4.5×10−6mm3/Nm for the ZrN films.
Very thin ZrC and ZrN films ( |
doi_str_mv | 10.1016/j.apsusc.2013.12.048 |
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Very thin ZrC and ZrN films (<500nm) were grown on (100) Si substrates at 500°C by the pulsed laser deposition (PLD) technique using a KrF excimer laser. X-ray reflectivity investigations showed that films exhibited mass densities similar to bulk values. X-ray diffraction investigations found that films were nanocristalline, exhibited a (111) texture and high micro-strain values. Auger electron spectroscopy investigations indicated that films contained in bulk a relatively low oxygen concentration, usually below 2.0%. Atomic force microscopy found that ZrN films deposited under 2×10−2Pa of N2 exhibited a very smooth surface, with an rms value of only 3Å, while wear tests found a low wear rate of only 4.5×10−6mm3/Nm.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2013.12.048</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Density ; Deposition ; Diffraction ; Exact sciences and technology ; Hard coatings ; Physics ; Pulsed laser deposition ; Surface layer ; Texture ; Thin films ; Wear tests ; X-rays ; ZrC ; ZrN</subject><ispartof>Applied surface science, 2014-07, Vol.306, p.33-36</ispartof><rights>2014 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-e6ce8e211617ccbf2607da9fd682c9796cecd057e25443e836ee3b2d635709463</citedby><cites>FETCH-LOGICAL-c369t-e6ce8e211617ccbf2607da9fd682c9796cecd057e25443e836ee3b2d635709463</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28499814$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Dorcioman, G.</creatorcontrib><creatorcontrib>Socol, G.</creatorcontrib><creatorcontrib>Craciun, D.</creatorcontrib><creatorcontrib>Argibay, N.</creatorcontrib><creatorcontrib>Lambers, E.</creatorcontrib><creatorcontrib>Hanna, M.</creatorcontrib><creatorcontrib>Taylor, C.R.</creatorcontrib><creatorcontrib>Craciun, V.</creatorcontrib><title>Wear tests of ZrC and ZrN thin films grown by pulsed laser deposition</title><title>Applied surface science</title><description>•ZrC and ZrN films were grown by pulsed laser deposition on Si wafers at 500°C.•AES investigations results indicated that films contain less than 2% O in bulk.•Uniaxial reciprocating sliding tests found a friction coefficient of around 0.3 and a wear rate of only 4.5×10−6mm3/Nm for the ZrN films.
Very thin ZrC and ZrN films (<500nm) were grown on (100) Si substrates at 500°C by the pulsed laser deposition (PLD) technique using a KrF excimer laser. X-ray reflectivity investigations showed that films exhibited mass densities similar to bulk values. X-ray diffraction investigations found that films were nanocristalline, exhibited a (111) texture and high micro-strain values. Auger electron spectroscopy investigations indicated that films contained in bulk a relatively low oxygen concentration, usually below 2.0%. Atomic force microscopy found that ZrN films deposited under 2×10−2Pa of N2 exhibited a very smooth surface, with an rms value of only 3Å, while wear tests found a low wear rate of only 4.5×10−6mm3/Nm.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Density</subject><subject>Deposition</subject><subject>Diffraction</subject><subject>Exact sciences and technology</subject><subject>Hard coatings</subject><subject>Physics</subject><subject>Pulsed laser deposition</subject><subject>Surface layer</subject><subject>Texture</subject><subject>Thin films</subject><subject>Wear tests</subject><subject>X-rays</subject><subject>ZrC</subject><subject>ZrN</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kM1LxDAQxYMouK7-Bx5yEby05qtpcxFk8QtEL4rgJWSTqWbptjXTVfzvjax49DSH93vzZh4hx5yVnHF9tirdiBv0pWBcllyUTDU7ZMabWhZV1ahdMsuYKZSUYp8cIK4Y4yKrM3L5DC7RCXBCOrT0JS2o60Oe93R6iz1tY7dG-pqGz54uv-i46RAC7RxCogHGAeMUh_6Q7LUuK0e_c06eri4fFzfF3cP17eLirvBSm6kA7aEBwbnmtffLVmhWB2faoBvhTW2y7AOrahCVUhIaqQHkUgQtq5oZpeWcnG73jml43-Sj7Tqih65zPQwbtFwrISrGucmo2qI-DYgJWjumuHbpy3Jmf1qzK7ttzf60ZrmwubVsO_lNcOhd1ybX-4h_XtEoYxquMne-5SC_-xEhWfQReg8hJvCTDUP8P-gbXWmDtw</recordid><startdate>20140701</startdate><enddate>20140701</enddate><creator>Dorcioman, G.</creator><creator>Socol, G.</creator><creator>Craciun, D.</creator><creator>Argibay, N.</creator><creator>Lambers, E.</creator><creator>Hanna, M.</creator><creator>Taylor, C.R.</creator><creator>Craciun, V.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20140701</creationdate><title>Wear tests of ZrC and ZrN thin films grown by pulsed laser deposition</title><author>Dorcioman, G. ; 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Very thin ZrC and ZrN films (<500nm) were grown on (100) Si substrates at 500°C by the pulsed laser deposition (PLD) technique using a KrF excimer laser. X-ray reflectivity investigations showed that films exhibited mass densities similar to bulk values. X-ray diffraction investigations found that films were nanocristalline, exhibited a (111) texture and high micro-strain values. Auger electron spectroscopy investigations indicated that films contained in bulk a relatively low oxygen concentration, usually below 2.0%. Atomic force microscopy found that ZrN films deposited under 2×10−2Pa of N2 exhibited a very smooth surface, with an rms value of only 3Å, while wear tests found a low wear rate of only 4.5×10−6mm3/Nm.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2013.12.048</doi><tpages>4</tpages></addata></record> |
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subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Density Deposition Diffraction Exact sciences and technology Hard coatings Physics Pulsed laser deposition Surface layer Texture Thin films Wear tests X-rays ZrC ZrN |
title | Wear tests of ZrC and ZrN thin films grown by pulsed laser deposition |
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