Loading…

Improving atomic layer deposition process through reactor scale simulation

In order to modify atomic layer deposition (ALD) characteristics of Al2O3, three-dimensional gas transports and film depositions are investigated through reactor scale simulations inside two different viscous flow reactors. In the top-inlet reactor (TIR), the gaseous species are directly injected in...

Full description

Saved in:
Bibliographic Details
Published in:International journal of heat and mass transfer 2014-11, Vol.78, p.1243-1253
Main Authors: Shaeri, Mohammad Reza, Jen, Tien-Chien, Yuan, Chris Yingchun
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c412t-240882a613fc7749999e773f6cf07913342e753fe072d2e69991e8d7f862e09d3
cites cdi_FETCH-LOGICAL-c412t-240882a613fc7749999e773f6cf07913342e753fe072d2e69991e8d7f862e09d3
container_end_page 1253
container_issue
container_start_page 1243
container_title International journal of heat and mass transfer
container_volume 78
creator Shaeri, Mohammad Reza
Jen, Tien-Chien
Yuan, Chris Yingchun
description In order to modify atomic layer deposition (ALD) characteristics of Al2O3, three-dimensional gas transports and film depositions are investigated through reactor scale simulations inside two different viscous flow reactors. In the top-inlet reactor (TIR), the gaseous species are directly injected into the substrates from the upper surface of the reactor while in the bottom-inlet reactor (BIR), the inlet is at the bottom of the reactor and next to the substrate. The numerical procedure to simulate the ALD process is thoroughly explained by using the multi-species and multi-reaction chemistry phenomena. The reactants are trimethylaluminum (TMA) and ozone, and the simulations are performed in an operating pressure of 10Torr (1330Pa) and two substrate temperatures of 250°C and 300°C. Due to the chemistry mechanism used in this study, a long ozone exposure is a crucial parameter to deliver a sufficiently oxidized substrate. For a specific reactor type, deposition rates are higher on the hotter substrate due to both a larger surface reaction rate constant and greater concentrations of the oxygen atoms on the substrate. At a fixed substrate temperature, higher deposition rates are obtained by using the TIR. The same deposition rate distributions are obtained among all cycles for each ALD process that result in the dependency of the film thickness only on the numbers of ALD cycles. For the substrate at 250°C, the growth rates are equal to 3.78Å/cycle and 4.43Å/cycle in the BIR and the TIR, respectively, and for the substrate at 300°C, the growth rates are equal to 4.52Å/cycle and 6.49Å/cycle in the BIR and the TIR, respectively.
doi_str_mv 10.1016/j.ijheatmasstransfer.2014.07.079
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1642256997</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0017931014006681</els_id><sourcerecordid>1642256997</sourcerecordid><originalsourceid>FETCH-LOGICAL-c412t-240882a613fc7749999e773f6cf07913342e753fe072d2e69991e8d7f862e09d3</originalsourceid><addsrcrecordid>eNqNUMtqwzAQFKWFpmn_Qcdc7EqyY9m3ltBHQqCX9iyEvEpkbCvVyoH8fRXSWy9dFpZlZofZIWTBWc4Zrx673HV70HHQiDHoES2EXDBe5kymbq7IjNeyyQSvm2syY4zLrCk4uyV3iN15ZWU1I5v1cAj-6MYd1dEPztBenyDQFg4eXXR-pAk3gEjjPvhpt6cBtIk-UDS6B4pumHp9Jt6TG6t7hIffOSdfry-fq_ds-_G2Xj1vM1NyETNRsroWuuKFNVKWTSqQsrCVsck2L4pSgFwWFpgUrYAq4RzqVtq6EsCatpiTxUU3GfueAKMaHBroez2Cn1DxqhRime5koj5dqCZ4xABWHYIbdDgpztQ5RtWpvzGqc4yKydRNkthcJCC9dHQJReNgNNC6ACaq1rv_i_0A72aI3g</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1642256997</pqid></control><display><type>article</type><title>Improving atomic layer deposition process through reactor scale simulation</title><source>Elsevier</source><creator>Shaeri, Mohammad Reza ; Jen, Tien-Chien ; Yuan, Chris Yingchun</creator><creatorcontrib>Shaeri, Mohammad Reza ; Jen, Tien-Chien ; Yuan, Chris Yingchun</creatorcontrib><description>In order to modify atomic layer deposition (ALD) characteristics of Al2O3, three-dimensional gas transports and film depositions are investigated through reactor scale simulations inside two different viscous flow reactors. In the top-inlet reactor (TIR), the gaseous species are directly injected into the substrates from the upper surface of the reactor while in the bottom-inlet reactor (BIR), the inlet is at the bottom of the reactor and next to the substrate. The numerical procedure to simulate the ALD process is thoroughly explained by using the multi-species and multi-reaction chemistry phenomena. The reactants are trimethylaluminum (TMA) and ozone, and the simulations are performed in an operating pressure of 10Torr (1330Pa) and two substrate temperatures of 250°C and 300°C. Due to the chemistry mechanism used in this study, a long ozone exposure is a crucial parameter to deliver a sufficiently oxidized substrate. For a specific reactor type, deposition rates are higher on the hotter substrate due to both a larger surface reaction rate constant and greater concentrations of the oxygen atoms on the substrate. At a fixed substrate temperature, higher deposition rates are obtained by using the TIR. The same deposition rate distributions are obtained among all cycles for each ALD process that result in the dependency of the film thickness only on the numbers of ALD cycles. For the substrate at 250°C, the growth rates are equal to 3.78Å/cycle and 4.43Å/cycle in the BIR and the TIR, respectively, and for the substrate at 300°C, the growth rates are equal to 4.52Å/cycle and 6.49Å/cycle in the BIR and the TIR, respectively.</description><identifier>ISSN: 0017-9310</identifier><identifier>EISSN: 1879-2189</identifier><identifier>DOI: 10.1016/j.ijheatmasstransfer.2014.07.079</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Atomic layer deposition ; Computer simulation ; Deposition ; Gas-phase reaction ; Mass deposition rate ; Mass transfer ; Navier–Stokes equation ; Nuclear reactors ; Ozone ; Reactors ; Surface reaction ; Surface reactions ; Three dimensional ; Viscous flow reactor</subject><ispartof>International journal of heat and mass transfer, 2014-11, Vol.78, p.1243-1253</ispartof><rights>2014 Elsevier Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c412t-240882a613fc7749999e773f6cf07913342e753fe072d2e69991e8d7f862e09d3</citedby><cites>FETCH-LOGICAL-c412t-240882a613fc7749999e773f6cf07913342e753fe072d2e69991e8d7f862e09d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Shaeri, Mohammad Reza</creatorcontrib><creatorcontrib>Jen, Tien-Chien</creatorcontrib><creatorcontrib>Yuan, Chris Yingchun</creatorcontrib><title>Improving atomic layer deposition process through reactor scale simulation</title><title>International journal of heat and mass transfer</title><description>In order to modify atomic layer deposition (ALD) characteristics of Al2O3, three-dimensional gas transports and film depositions are investigated through reactor scale simulations inside two different viscous flow reactors. In the top-inlet reactor (TIR), the gaseous species are directly injected into the substrates from the upper surface of the reactor while in the bottom-inlet reactor (BIR), the inlet is at the bottom of the reactor and next to the substrate. The numerical procedure to simulate the ALD process is thoroughly explained by using the multi-species and multi-reaction chemistry phenomena. The reactants are trimethylaluminum (TMA) and ozone, and the simulations are performed in an operating pressure of 10Torr (1330Pa) and two substrate temperatures of 250°C and 300°C. Due to the chemistry mechanism used in this study, a long ozone exposure is a crucial parameter to deliver a sufficiently oxidized substrate. For a specific reactor type, deposition rates are higher on the hotter substrate due to both a larger surface reaction rate constant and greater concentrations of the oxygen atoms on the substrate. At a fixed substrate temperature, higher deposition rates are obtained by using the TIR. The same deposition rate distributions are obtained among all cycles for each ALD process that result in the dependency of the film thickness only on the numbers of ALD cycles. For the substrate at 250°C, the growth rates are equal to 3.78Å/cycle and 4.43Å/cycle in the BIR and the TIR, respectively, and for the substrate at 300°C, the growth rates are equal to 4.52Å/cycle and 6.49Å/cycle in the BIR and the TIR, respectively.</description><subject>Atomic layer deposition</subject><subject>Computer simulation</subject><subject>Deposition</subject><subject>Gas-phase reaction</subject><subject>Mass deposition rate</subject><subject>Mass transfer</subject><subject>Navier–Stokes equation</subject><subject>Nuclear reactors</subject><subject>Ozone</subject><subject>Reactors</subject><subject>Surface reaction</subject><subject>Surface reactions</subject><subject>Three dimensional</subject><subject>Viscous flow reactor</subject><issn>0017-9310</issn><issn>1879-2189</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqNUMtqwzAQFKWFpmn_Qcdc7EqyY9m3ltBHQqCX9iyEvEpkbCvVyoH8fRXSWy9dFpZlZofZIWTBWc4Zrx673HV70HHQiDHoES2EXDBe5kymbq7IjNeyyQSvm2syY4zLrCk4uyV3iN15ZWU1I5v1cAj-6MYd1dEPztBenyDQFg4eXXR-pAk3gEjjPvhpt6cBtIk-UDS6B4pumHp9Jt6TG6t7hIffOSdfry-fq_ds-_G2Xj1vM1NyETNRsroWuuKFNVKWTSqQsrCVsck2L4pSgFwWFpgUrYAq4RzqVtq6EsCatpiTxUU3GfueAKMaHBroez2Cn1DxqhRime5koj5dqCZ4xABWHYIbdDgpztQ5RtWpvzGqc4yKydRNkthcJCC9dHQJReNgNNC6ACaq1rv_i_0A72aI3g</recordid><startdate>20141101</startdate><enddate>20141101</enddate><creator>Shaeri, Mohammad Reza</creator><creator>Jen, Tien-Chien</creator><creator>Yuan, Chris Yingchun</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>H8D</scope><scope>KR7</scope><scope>L7M</scope></search><sort><creationdate>20141101</creationdate><title>Improving atomic layer deposition process through reactor scale simulation</title><author>Shaeri, Mohammad Reza ; Jen, Tien-Chien ; Yuan, Chris Yingchun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c412t-240882a613fc7749999e773f6cf07913342e753fe072d2e69991e8d7f862e09d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Atomic layer deposition</topic><topic>Computer simulation</topic><topic>Deposition</topic><topic>Gas-phase reaction</topic><topic>Mass deposition rate</topic><topic>Mass transfer</topic><topic>Navier–Stokes equation</topic><topic>Nuclear reactors</topic><topic>Ozone</topic><topic>Reactors</topic><topic>Surface reaction</topic><topic>Surface reactions</topic><topic>Three dimensional</topic><topic>Viscous flow reactor</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shaeri, Mohammad Reza</creatorcontrib><creatorcontrib>Jen, Tien-Chien</creatorcontrib><creatorcontrib>Yuan, Chris Yingchun</creatorcontrib><collection>CrossRef</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>International journal of heat and mass transfer</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shaeri, Mohammad Reza</au><au>Jen, Tien-Chien</au><au>Yuan, Chris Yingchun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Improving atomic layer deposition process through reactor scale simulation</atitle><jtitle>International journal of heat and mass transfer</jtitle><date>2014-11-01</date><risdate>2014</risdate><volume>78</volume><spage>1243</spage><epage>1253</epage><pages>1243-1253</pages><issn>0017-9310</issn><eissn>1879-2189</eissn><abstract>In order to modify atomic layer deposition (ALD) characteristics of Al2O3, three-dimensional gas transports and film depositions are investigated through reactor scale simulations inside two different viscous flow reactors. In the top-inlet reactor (TIR), the gaseous species are directly injected into the substrates from the upper surface of the reactor while in the bottom-inlet reactor (BIR), the inlet is at the bottom of the reactor and next to the substrate. The numerical procedure to simulate the ALD process is thoroughly explained by using the multi-species and multi-reaction chemistry phenomena. The reactants are trimethylaluminum (TMA) and ozone, and the simulations are performed in an operating pressure of 10Torr (1330Pa) and two substrate temperatures of 250°C and 300°C. Due to the chemistry mechanism used in this study, a long ozone exposure is a crucial parameter to deliver a sufficiently oxidized substrate. For a specific reactor type, deposition rates are higher on the hotter substrate due to both a larger surface reaction rate constant and greater concentrations of the oxygen atoms on the substrate. At a fixed substrate temperature, higher deposition rates are obtained by using the TIR. The same deposition rate distributions are obtained among all cycles for each ALD process that result in the dependency of the film thickness only on the numbers of ALD cycles. For the substrate at 250°C, the growth rates are equal to 3.78Å/cycle and 4.43Å/cycle in the BIR and the TIR, respectively, and for the substrate at 300°C, the growth rates are equal to 4.52Å/cycle and 6.49Å/cycle in the BIR and the TIR, respectively.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.ijheatmasstransfer.2014.07.079</doi><tpages>11</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0017-9310
ispartof International journal of heat and mass transfer, 2014-11, Vol.78, p.1243-1253
issn 0017-9310
1879-2189
language eng
recordid cdi_proquest_miscellaneous_1642256997
source Elsevier
subjects Atomic layer deposition
Computer simulation
Deposition
Gas-phase reaction
Mass deposition rate
Mass transfer
Navier–Stokes equation
Nuclear reactors
Ozone
Reactors
Surface reaction
Surface reactions
Three dimensional
Viscous flow reactor
title Improving atomic layer deposition process through reactor scale simulation
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T19%3A24%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Improving%20atomic%20layer%20deposition%20process%20through%20reactor%20scale%20simulation&rft.jtitle=International%20journal%20of%20heat%20and%20mass%20transfer&rft.au=Shaeri,%20Mohammad%20Reza&rft.date=2014-11-01&rft.volume=78&rft.spage=1243&rft.epage=1253&rft.pages=1243-1253&rft.issn=0017-9310&rft.eissn=1879-2189&rft_id=info:doi/10.1016/j.ijheatmasstransfer.2014.07.079&rft_dat=%3Cproquest_cross%3E1642256997%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c412t-240882a613fc7749999e773f6cf07913342e753fe072d2e69991e8d7f862e09d3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1642256997&rft_id=info:pmid/&rfr_iscdi=true