On the role of analytical electron microscopy in the study of some HTSC crystals

Microscopic investigation have been carried out to characterise and assess some flux grown cuprate crystals. In addition to optical and electron microscopic examinations, microanalysis was carried out both by electron microprobe analysis (EPMA) and by high resolution analytical electron microscopy (...

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Bibliographic Details
Published in:Physica. C, Superconductivity Superconductivity, 1993, Vol.204 (3), p.394-398
Main Authors: Chowdhury, A.J.S., Wanklyn, B.M.R., Hodby, J.W.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Inorganic compounds
Physics
Structure of solids and liquids
crystallography
Structure of specific crystalline solids
Water, oxides, hydroxides, peroxides
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Summary:Microscopic investigation have been carried out to characterise and assess some flux grown cuprate crystals. In addition to optical and electron microscopic examinations, microanalysis was carried out both by electron microprobe analysis (EPMA) and by high resolution analytical electron microscopy (AEM or sometimes referred to as TEM analysis). While EPMA can be used for analysis on an area of a few microns square, AEM analysis is performed on a much smaller area (i.e. on ∼ 30 nm square). The distribution of dopants and the impurity ions in the crystals were studied. AEM was found to be essential in determining the inhomogeneities of imourity ions and dopants on a nanometer scale. We discuss the implications of such inhomogeneities.
ISSN:0921-4534
1873-2143
DOI:10.1016/0921-4534(93)91025-Q