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Approximate linear relation between reduced modulus and stiffness in completely amorphous Si–C–N films
An approximately linear relation between reduced modulus (Er) and stiffness (S) was observed based on the characterization of completely amorphous Si–C–N hard films by means of nanoindentation. This linear relation was verified by a series of amorphous Si–C–N films prepared under different experimen...
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Published in: | Surface & coatings technology 2014-11, Vol.258, p.343-346 |
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container_title | Surface & coatings technology |
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creator | Zhuang, Chunqiang Fuchs, Regina Schlemper, Christoph Zhang, Lei Vogel, Michael Staedler, Thorsten Jiang, Xin |
description | An approximately linear relation between reduced modulus (Er) and stiffness (S) was observed based on the characterization of completely amorphous Si–C–N hard films by means of nanoindentation. This linear relation was verified by a series of amorphous Si–C–N films prepared under different experimental conditions. Furthermore the linear relation can be extended to amorphous Si–B–C–N film systems. This finding provides one possible way to evaluate the hardness and reduced modulus of a material without involving the contact area.
•Synthesizing completely amorphous Si–(B)–C–N hard films•Obtaining hard films with very smooth surface•Finding approximate linear relation between reduced modulus and stiffness |
doi_str_mv | 10.1016/j.surfcoat.2014.09.004 |
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source | ScienceDirect Freedom Collection 2022-2024 |
subjects | Approximation Coatings Contact Cross-disciplinary physics: materials science rheology Erbium Exact sciences and technology Hardness Linear relation Materials science Nanoindentation Physics Reduced modulus Stiffness Surface treatments |
title | Approximate linear relation between reduced modulus and stiffness in completely amorphous Si–C–N films |
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