Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution

We discuss here the design of constant-stress accelerated life-tests for one-shot device testing by assuming a Weibull distribution as a lifetime model. Because there are no explicit expressions for the maximum likelihood estimators of the model parameters and their variances, we adopt the asymptoti...

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Bibliographic Details
Published in:IEEE transactions on reliability 2014-12, Vol.63 (4), p.944-952
Main Authors: Balakrishnan, Narayanaswamy, Man Ho Ling
Format: Article
Language:English
Subjects:
Accelerated life-test
Algorithms
Asymptotic properties
asymptotic variance
best test plan
censoring
Devices
Economic models
Inspection
Mathematical models
Maximum likelihood estimation
non-constant shape parameter
one-shot device
reliability
Reliability engineering
Sensitivity analysis
Shape
Stress
Stresses
Weibull distribution
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Summary:We discuss here the design of constant-stress accelerated life-tests for one-shot device testing by assuming a Weibull distribution as a lifetime model. Because there are no explicit expressions for the maximum likelihood estimators of the model parameters and their variances, we adopt the asymptotic approach here to develop an algorithm for the determination of optimal allocation of devices, inspection frequency, and the number of inspections at each stress level, by assuming a Weibull distribution with non-constant scale and shape parameters as the lifetime distribution. The asymptotic variance of the estimate of reliability of the device at a specified mission time is minimized subject to a pre-fixed experimental budget, and a termination time. Examples are provided to illustrate the proposed algorithm for the determination of the best test plan. A sensitivity analysis of the best test plan is also carried out to examine the effect of misspecification of the model parameters.
ISSN:0018-9529
1558-1721
DOI:10.1109/TR.2014.2336391