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Emission and detection of terahertz radiation using two-dimensional plasmons in semiconductor nanoheterostructures for nondestructive evaluations

The recent advances in emission and detection of terahertz radiation using two-dimensional (2-D) plasmons in semiconductor nanoheterostructures for nondestructive evaluations are reviewed. The 2-D plasmon resonance is introduced as the operation principle for broadband emission and detection of tera...

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Published in:	Optical engineering 2014-03, Vol.53 (3), p.031206-031206
Main Authors:	Otsuji, Taiichi, Watanabe, Takayuki, Tombet, Stephane Albon Boubanga, Satou, Akira, Ryzhii, Victor, Popov, Vyacheslav, Knap, Wojciech
Format:	Article
Language:	English
Subjects:	Condensed Matter Emission Emission analysis Gallium arsenide Materials Science Nanostructure Nondestructive testing Physics Plasmons Semiconductors Two dimensional
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creator	Otsuji, Taiichi Watanabe, Takayuki Tombet, Stephane Albon Boubanga Satou, Akira Ryzhii, Victor Popov, Vyacheslav Knap, Wojciech
description	The recent advances in emission and detection of terahertz radiation using two-dimensional (2-D) plasmons in semiconductor nanoheterostructures for nondestructive evaluations are reviewed. The 2-D plasmon resonance is introduced as the operation principle for broadband emission and detection of terahertz radiation. The device structure is based on a high-electron-mobility transistor and incorporates the authors' original asymmetrically interdigitated dual-grating gates. Excellent THz emission and detection performances are experimentally demonstrated by using InAlAs/InGaAs/InP and/or InGaP/InGaAs/GaAs heterostructure material systems. Their applications to nondestructive material evaluation based on THz imaging are also presented.
doi_str_mv	10.1117/1.OE.53.3.031206
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subjects	Condensed Matter Emission Emission analysis Gallium arsenide Materials Science Nanostructure Nondestructive testing Physics Plasmons Semiconductors Two dimensional
title	Emission and detection of terahertz radiation using two-dimensional plasmons in semiconductor nanoheterostructures for nondestructive evaluations
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