Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction

• Published in: Journal of synchrotron radiation 2015-01, Vol.22 (1), p.67-75
• Main Authors: Köhl, Martin, Schroth, Philipp, Minkevich, Andrey A., Hornung, Jean-Wolfgang, Dimakis, Emmanouil, Somaschini, Claudio, Geelhaar, Lutz, Aschenbrenner, Timo, Lazarev, Sergey, Grigoriev, Daniil, Pietsch, Ullrich, Baumbach, Tilo
• Format: Article
• Language: English
• Subjects: Blends; Diffraction; GaAs; Gallium arsenide; Gallium arsenides; nanofocus; Nanowires; Polytypes; polytypism; Wurtzite; X-ray diffraction; Zinc
• ISSN: 1600-5775; 0909-0495; 1600-5775
• DOI: 10.1107/S1600577514023480

In GaAs nanowires grown along the cubic [111]c direction, zinc blende and wurtzite arrangements have been observed in their stacking sequence, since the energetic barriers for nucleation are typically of similar order of magnitude. It is known that the interplanar spacing of the (111)c Ga (or As) planes in the zinc blende polytype varies slightly from the wurtzite polytype. However, different values have been reported in the literature. Here, the ratio of the interplanar spacing of these polytypes is extracted based on X‐ray diffraction measurements for thin GaAs nanowires with a mean diameter of 18–25 nm. The measurements are performed with a nano‐focused beam which facilitates the separation of the scattering of nanowires and of parasitic growth. The interplanar spacing of the (111)c Ga (or As) planes in the wurtzite arrangement in GaAs nanowires is observed to be 0.66% ± 0.02% larger than in the zinc blende arrangement.