Raman spectroscopy on mechanically exfoliated pristine graphene ribbons

We present Raman spectroscopy measurements of non‐etched graphene nanoribbons, with widths ranging from 15 to 160 nm, where the D‐line intensity is strongly dependent on the polarization direction of the incident light. The extracted edge disorder correlation length is approximately one order of mag...

Full description

Saved in:
Bibliographic Details
Published in:Physica Status Solidi. B: Basic Solid State Physics 2014-12, Vol.251 (12), p.2551-2555
Main Authors: Terrés, Bernat, Reichardt, Sven, Neumann, Christoph, Watanabe, Kenji, Taniguchi, Takashi, Stampfer, Christoph
Format: Article
Language:English
Subjects:
Boron nitride
Correlation
Disorders
Graphene
graphene ribbons
hexagonal boron nitride
Nanostructure
Phonons
Raman spectroscopy
Ribbons
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present Raman spectroscopy measurements of non‐etched graphene nanoribbons, with widths ranging from 15 to 160 nm, where the D‐line intensity is strongly dependent on the polarization direction of the incident light. The extracted edge disorder correlation length is approximately one order of magnitude larger than on previously reported graphene ribbons fabricated by reactive ion etching techniques. This suggests a more regular crystallographic orientation of the non‐etched graphene ribbons here presented. We further report on the ribbons width dependence of the line‐width and frequency of the long‐wavelength optical phonon mode (G‐line) and the 2D‐line in the studied graphene ribbons. Scanning force microscope image of graphene ribbons on hexagonal boron nitride and SiO2 substrates. The scale bar is 1μm.
ISSN:0370-1972
1521-3951
DOI:10.1002/pssb.201451398