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Water absorption characterisation, electrical reliability and mechanical testing of a submerged laminated a-Si thin film photovoltaic (PV) cells

•Water absorption characterisation for ETFE laminated PV.•45day electrical testing.•Bi-lateral tensile testing.•Diffusion coefficient for diffusion models. Floating photovoltaic (PV) technology is emerging as a new application field for solar PVs. The research in this paper aims to characterise the...

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Published in:Microelectronics and reliability 2014-11, Vol.54 (11), p.2456-2462
Main Authors: Trapani, Kim, Martens, Steve, Challagulla, Krishna, Yong, Salina, Millar, Dean, Maloney, Sean
Format: Article
Language:English
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Summary:•Water absorption characterisation for ETFE laminated PV.•45day electrical testing.•Bi-lateral tensile testing.•Diffusion coefficient for diffusion models. Floating photovoltaic (PV) technology is emerging as a new application field for solar PVs. The research in this paper aims to characterise the water absorption in ETFE laminated a-Si PV panels in relation to the floating PV application and scope any apparent electrical or mechanical impacts. Short term electrical impacts were analysed through 45day testing of such a floating thin film PV array, for which results showed greater reduction at 1% due to sediment/dirt accumulation on the face of the array rather than due to water absorption which accounted to 0.5%. The stiffness of sample panels of such array, saturated and dry was tested in order to assess any significant changes which might impact such an array’s modulation with oncoming waves. Results showed only minor changes in the deformation stiffness modulus of the two sets of samples, indicated that mechanical reliability would not be compromised due to water absorption. Observations made throughout the various stages of the experimentation were noted in the article and discussed upon. Concluding recommendations are for longer term electrical testing to be undertaken in order to determine if water absorption will have deteriorating effects in the long run.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2014.06.009