Direct correlation between reliability and pH changes of phosphors for white light-emitting diodes

•The long-term reliability of an LED package induced by phosphor is measured.•The change of pH in deionized water after soaking phosphors is measured.•The long-term reliability can be predicted by measuring the pH. The reactivity of phosphor with water was investigated by measuring pH change, and th...

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Bibliographic Details
Published in:Microelectronics and reliability 2014-12, Vol.54 (12), p.2849-2852
Main Authors: Choi, Minho, Kim, Ki Hyun, Yun, Changhun, Koo, Dai Hyoung, Song, Sang Bin, Kim, Jae Pil
Format: Article
Language:English
Subjects:
Applied sciences
Correlation
Degradation
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Inductively coupled plasma
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Integrated circuits
Light-emitting diode (LED)
Optical emission spectroscopy
Optoelectronic devices
Packages
Phosphor
Phosphors
Physics
Reliability
Scanning electron microscopy
Scanning probe microscopes, components and techniques
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Slopes
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Summary:•The long-term reliability of an LED package induced by phosphor is measured.•The change of pH in deionized water after soaking phosphors is measured.•The long-term reliability can be predicted by measuring the pH. The reactivity of phosphor with water was investigated by measuring pH change, and the results are compared with long-term reliability test results as well as scanning electron microscope (SEM) and inductively coupled plasma optical emission spectroscopy (ICP-OES) results. We found that the slope of pH change strongly depends on phosphor composition and represents a long-term reliability test result induced by phosphor in an LED package.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2014.07.141