Characterization of oxygen ion beams emitted from plasma focus

The Lee model is modified to include oxygen in addition to other gases. It is then applied to characterize the ion beams emitted from the low energy plasma focus PF 1 kJ device operated with oxygen gas. The numerical experiments give the following results: ion fluence- 3 × 1018 ions m−2, ion flux- 2...

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Bibliographic Details
Published in:Vacuum 2014-12, Vol.110, p.54-57
Main Authors: Akel, Mohamad, Salo, Sami Alsheikh, Saw, Sor Heoh, Lee, Sing
Format: Article
Language:English
Subjects:
Benchmarking
Damage
Devices
Emittance
Ion beam
Ion beams
Lee model
Mathematical models
Oxygen gas
Plasma focus
Scaling law
Trends
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Summary:The Lee model is modified to include oxygen in addition to other gases. It is then applied to characterize the ion beams emitted from the low energy plasma focus PF 1 kJ device operated with oxygen gas. The numerical experiments give the following results: ion fluence- 3 × 1018 ions m−2, ion flux- 2.4 × 1026 ions m−2 s−1, ion energy- 261 keV, ion number- 3.5 × 1013, ion current- 3.5 kA, and damage factor- 1.12 × 109 Wm−2 s0.5. Numerical experiments are systematically carried out on other plasma focus devices of various energies. Scaling trends are suggested for oxygen ion beam characteristics. These results provide much needed benchmark reference values and scaling trends for ion beams of a plasma focus operated in oxygen gas. •The Lee model is modified to include oxygen in addition to other gases.•It is then applied to study the properties of ion beams emitted from various energies.•Plasma focus devices operated with oxygen gas.•Scaling trends are suggested for oxygen ion beam characteristics.
ISSN:0042-207X
1879-2715
DOI:10.1016/j.vacuum.2014.08.011