Epitaxial growth of CeO2(111) film on Ru(0001): scanning tunneling microscopy (STM) and x-ray photoemission spectroscopy (XPS) study

• Published in: The Journal of chemical physics 2014-01, Vol.140 (4), p.044711-044711
• Main Authors: Hasegawa, Tomo, Shahed, Syed Mohammad Fakruddin, Sainoo, Yasuyuki, Beniya, Atsushi, Isomura, Noritake, Watanabe, Yoshihide, Komeda, Tadahiro
• Format: Article
• Language: English
• Subjects: Cerium oxides; Epitaxial growth; High temperature; Photoelectric emission; Reduction; Scanning tunneling microscopy; Spectrum analysis; Substrates; X ray photoelectron spectroscopy; X ray spectra
• ISSN: 0021-9606; 1089-7690
• DOI: 10.1063/1.4849595

We formed an epitaxial film of CeO2(111) by sublimating Ce atoms on Ru(0001) surface kept at elevated temperature in an oxygen ambient. X-ray photoemission spectroscopy measurement revealed a decrease of Ce(4+)/Ce(3+) ratio in a small temperature window of the growth temperature between 1070 and 1096 K, which corresponds to the reduction of the CeO2(111). Scanning tunneling microscope image showed that a film with a wide terrace and a sharp step edge was obtained when the film was grown at the temperatures close to the reduction temperature, and the terrace width observed on the sample grown at 1060 K was more than twice of that grown at 1040 K. On the surface grown above the reduction temperature, the surface with a wide terrace and a sharp step was confirmed, but small dots were also seen in the terrace part, which are considerably Ce atoms adsorbed at the oxygen vacancies on the reduced surface. This experiment demonstrated that it is required to use the substrate temperature close to the reduction temperature to obtain CeO2(111) with wide terrace width and sharp step edges.