Low-Temperature-Fired ReVO4 (Re = La, Ce) Microwave Dielectric Ceramics

We report a series of ReVO4 (Re = La, Ce) microwave dielectric ceramics fabricated by a standard solid‐state reaction method. X‐ray diffraction and scanning electron microscopy measurements were performed to explore the phase purity, sintering behavior, and microstructure. The analysis revealed that...

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Bibliographic Details
Published in:Journal of the American Ceramic Society 2015-01, Vol.98 (1), p.1-4
Main Authors: Wang, Yang, Zuo, Ruzhong, Zhang, Chen, Zhang, Jian, Zhang, Tianwen
Format: Article
Language:English
Subjects:
Ceramics
Dielectrics
Diffraction
Microstructure
Microwaves
Sintering
X-rays
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Summary:We report a series of ReVO4 (Re = La, Ce) microwave dielectric ceramics fabricated by a standard solid‐state reaction method. X‐ray diffraction and scanning electron microscopy measurements were performed to explore the phase purity, sintering behavior, and microstructure. The analysis revealed that pure and dense monoclinic LaVO4 ceramics with a monazite structure and tetragonal CeVO4 ceramics with a zircon structure could be obtained in their respective sintering temperature range. Furthermore, LaVO4 and CeVO4 ceramics sintered at 850°C and 950°C for 4 h possessed out‐bound microwave dielectric properties: εr = 14.2, Q × f = 48197 GHz, τf = −37.9 ppm/°C, and εr = 12.3, Q × f = 41 460 GHz, τf = −34.4 ppm/°C, respectively. The overall results suggest that the ReVO4 ceramics could be promising materials for low‐temperature‐cofired ceramic technology.
ISSN:0002-7820
1551-2916
DOI:10.1111/jace.13378