Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques

(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowt...

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Bibliographic Details
Published in:Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave 2014-12, Vol.21 (341), p.137-142
Main Authors: Mišík, Jozef, Pekarčíková, Marcela, Janovec, Jozef
Format: Article
Language:English
Subjects:
(RE)BCO thin film
Defects
Density
Deposition
Heterogeneity
HTS tape
Materials science
MOCVD
outgrowths
PLD
Scanning electron microscopy
Structural analysis
Thin films
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Summary:(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.
ISSN:1338-0532
1336-1589
1338-0532
DOI:10.2478/rput-2014-0020