Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques

(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowt...

Full description

Saved in:
Bibliographic Details
Published in:Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave 2014-12, Vol.21 (341), p.137-142
Main Authors: Mišík, Jozef, Pekarčíková, Marcela, Janovec, Jozef
Format: Article
Language:English
Subjects:
(RE)BCO thin film
Defects
Density
Deposition
Heterogeneity
HTS tape
Materials science
MOCVD
outgrowths
PLD
Scanning electron microscopy
Structural analysis
Thin films
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 142
container_issue 341
container_start_page 137
container_title Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave
container_volume 21
creator Mišík, Jozef
Pekarčíková, Marcela
Janovec, Jozef
description (RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.
doi_str_mv 10.2478/rput-2014-0020
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1669848592</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3747735521</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2507-4e59719653c8f6e7e4471ff9e313000966557a84a0dc9f979ef0a8ec93043f323</originalsourceid><addsrcrecordid>eNqdkD1PwzAQhiMEEhV0ZbbEUoYUfyW2FyQon1IRqJQ5Ms6ZpkrjYieg8OtJ1A4VYmK6G573vdMTRScEjykX8tyvmzqmmPAYY4r3ogFhTMY4YXR_Zz-MhiEsMcYk4YIJPohmL7VvTN14XaLJQnttavDFt64LVyFn0WgGZ1fGoaluwaNrWLtQ1JCjtxY9lznSVY4enfnM0RzMoio-GgjH0YHVZYDhdh5Fr7c388l9PH26e5hcTmNDEyxiDokSRKUJM9KmIIBzQaxVwAjrPlRpmiRCS65xbpRVQoHFWoJRDHNmGWVH0WjTu_auv1tnqyIYKEtdgWtCRtJUSS4T1aOnv9Cla3zVfddRSlDJscQdNd5QxrsQPNhs7YuV9m1GcNZbznrLWW856y13gYtN4EuXnbYc3n3TdstO-59BShknhIn_F5BtwQ-YTJZw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1697284080</pqid></control><display><type>article</type><title>Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques</title><source>Publicly Available Content (ProQuest)</source><creator>Mišík, Jozef ; Pekarčíková, Marcela ; Janovec, Jozef</creator><creatorcontrib>Mišík, Jozef ; Pekarčíková, Marcela ; Janovec, Jozef</creatorcontrib><description>(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.</description><identifier>ISSN: 1338-0532</identifier><identifier>ISSN: 1336-1589</identifier><identifier>EISSN: 1338-0532</identifier><identifier>DOI: 10.2478/rput-2014-0020</identifier><language>eng</language><publisher>Bratislava: De Gruyter Open</publisher><subject>(RE)BCO thin film ; Defects ; Density ; Deposition ; Heterogeneity ; HTS tape ; Materials science ; MOCVD ; outgrowths ; PLD ; Scanning electron microscopy ; Structural analysis ; Thin films</subject><ispartof>Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave, 2014-12, Vol.21 (341), p.137-142</ispartof><rights>Copyright De Gruyter Open Sp. z o.o. 2014</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/1697284080?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,25753,27924,27925,37012,37013,44590</link.rule.ids></links><search><creatorcontrib>Mišík, Jozef</creatorcontrib><creatorcontrib>Pekarčíková, Marcela</creatorcontrib><creatorcontrib>Janovec, Jozef</creatorcontrib><title>Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques</title><title>Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave</title><description>(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.</description><subject>(RE)BCO thin film</subject><subject>Defects</subject><subject>Density</subject><subject>Deposition</subject><subject>Heterogeneity</subject><subject>HTS tape</subject><subject>Materials science</subject><subject>MOCVD</subject><subject>outgrowths</subject><subject>PLD</subject><subject>Scanning electron microscopy</subject><subject>Structural analysis</subject><subject>Thin films</subject><issn>1338-0532</issn><issn>1336-1589</issn><issn>1338-0532</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNqdkD1PwzAQhiMEEhV0ZbbEUoYUfyW2FyQon1IRqJQ5Ms6ZpkrjYieg8OtJ1A4VYmK6G573vdMTRScEjykX8tyvmzqmmPAYY4r3ogFhTMY4YXR_Zz-MhiEsMcYk4YIJPohmL7VvTN14XaLJQnttavDFt64LVyFn0WgGZ1fGoaluwaNrWLtQ1JCjtxY9lznSVY4enfnM0RzMoio-GgjH0YHVZYDhdh5Fr7c388l9PH26e5hcTmNDEyxiDokSRKUJM9KmIIBzQaxVwAjrPlRpmiRCS65xbpRVQoHFWoJRDHNmGWVH0WjTu_auv1tnqyIYKEtdgWtCRtJUSS4T1aOnv9Cla3zVfddRSlDJscQdNd5QxrsQPNhs7YuV9m1GcNZbznrLWW856y13gYtN4EuXnbYc3n3TdstO-59BShknhIn_F5BtwQ-YTJZw</recordid><startdate>20141201</startdate><enddate>20141201</enddate><creator>Mišík, Jozef</creator><creator>Pekarčíková, Marcela</creator><creator>Janovec, Jozef</creator><general>De Gruyter Open</general><general>De Gruyter Poland</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BYOGL</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>7SR</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope></search><sort><creationdate>20141201</creationdate><title>Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques</title><author>Mišík, Jozef ; Pekarčíková, Marcela ; Janovec, Jozef</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2507-4e59719653c8f6e7e4471ff9e313000966557a84a0dc9f979ef0a8ec93043f323</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>(RE)BCO thin film</topic><topic>Defects</topic><topic>Density</topic><topic>Deposition</topic><topic>Heterogeneity</topic><topic>HTS tape</topic><topic>Materials science</topic><topic>MOCVD</topic><topic>outgrowths</topic><topic>PLD</topic><topic>Scanning electron microscopy</topic><topic>Structural analysis</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mišík, Jozef</creatorcontrib><creatorcontrib>Pekarčíková, Marcela</creatorcontrib><creatorcontrib>Janovec, Jozef</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>East Europe, Central Europe Database</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central</collection><collection>SciTech Premium Collection</collection><collection>https://resources.nclive.org/materials</collection><collection>Materials Science Collection</collection><collection>Publicly Available Content (ProQuest)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineered Materials Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><jtitle>Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mišík, Jozef</au><au>Pekarčíková, Marcela</au><au>Janovec, Jozef</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques</atitle><jtitle>Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave</jtitle><date>2014-12-01</date><risdate>2014</risdate><volume>21</volume><issue>341</issue><spage>137</spage><epage>142</epage><pages>137-142</pages><issn>1338-0532</issn><issn>1336-1589</issn><eissn>1338-0532</eissn><abstract>(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.</abstract><cop>Bratislava</cop><pub>De Gruyter Open</pub><doi>10.2478/rput-2014-0020</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1338-0532
ispartof Vedecké práce Materiálovotechnologickej fakulty Slovenskej technickej univerzity v Bratislave so sídlom v Trnave, 2014-12, Vol.21 (341), p.137-142
issn 1338-0532
1336-1589
1338-0532
language eng
recordid cdi_proquest_miscellaneous_1669848592
source Publicly Available Content (ProQuest)
subjects (RE)BCO thin film
Defects
Density
Deposition
Heterogeneity
HTS tape
Materials science
MOCVD
outgrowths
PLD
Scanning electron microscopy
Structural analysis
Thin films
title Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T23%3A34%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20Characterization%20of%20(Re)Bco%20Layer%20Deposited%20by%20Pld%20and%20Mocvd%20Techniques&rft.jtitle=Vedeck%C3%A9%20pr%C3%A1ce%20Materi%C3%A1lovotechnologickej%20fakulty%20Slovenskej%20technickej%20univerzity%20v%20Bratislave%20so%20s%C3%ADdlom%20v%20Trnave&rft.au=Mi%C5%A1%C3%ADk,%20Jozef&rft.date=2014-12-01&rft.volume=21&rft.issue=341&rft.spage=137&rft.epage=142&rft.pages=137-142&rft.issn=1338-0532&rft.eissn=1338-0532&rft_id=info:doi/10.2478/rput-2014-0020&rft_dat=%3Cproquest_cross%3E3747735521%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c2507-4e59719653c8f6e7e4471ff9e313000966557a84a0dc9f979ef0a8ec93043f323%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1697284080&rft_id=info:pmid/&rfr_iscdi=true