Anomalous scattering factor using proton induced X-ray emission technique

Atomic scattering factor is in general a complex number represented by the sum of normal scattering factor (f0) and anomalous scattering factors [real (f′) and imaginary (f″)]. Anomalous scattering factors in Ag, In, Cd and Sn were determined experimentally from attenuation data measured using PIXE...

Full description

Saved in:
Bibliographic Details
Published in:Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2015-02, Vol.107, p.103-108
Main Authors: Latha, P., Magudapathy, P., Abdullah, K.K., Nair, K.G.M., Babu, B.R.S., Varier, K.M.
Format: Article
Language:English
Subjects:
Anomalous scattering factor
Atomic properties
Attenuation
Cadmium
Complex numbers
Dispersion correction
Emission
Mass attenuation coefficient
Photoelectric cross section
PIXE
Scattering
Silver
Tin
Total cross section
X-rays
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Atomic scattering factor is in general a complex number represented by the sum of normal scattering factor (f0) and anomalous scattering factors [real (f′) and imaginary (f″)]. Anomalous scattering factors in Ag, In, Cd and Sn were determined experimentally from attenuation data measured using PIXE and compared with theoretical values. The data cover the energy region from 10 to 30keV and atomic number Z from 47 to 50keV. Our results found to be in close agreement with theoretical values. •Anomalous scattering factors determined from the attenuation data.•PIXE technique is used for getting the attenuation data.•Our results are in close agreement with the available theoretical values.•PIXE technique is a reliable tool for determining anomalous scattering factors.
ISSN:0969-806X
1879-0895
DOI:10.1016/j.radphyschem.2014.09.016