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Application of high voltage current limiting fuse model using ATP-draw
This paper presents the results of arcing energy by the initiation of arcing, the arc clearing voltage, the system impedance (X/R), and the making angle. To perform this analysis, current limiting fuse (CLF) model was developed using the ATP-Draw program. The violent activation of arc is affected by...
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Published in: | IEEE transactions on dielectrics and electrical insulation 2010-12, Vol.17 (6), p.1806-1813 |
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container_title | IEEE transactions on dielectrics and electrical insulation |
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creator | Lee, Sei-Hyun |
description | This paper presents the results of arcing energy by the initiation of arcing, the arc clearing voltage, the system impedance (X/R), and the making angle. To perform this analysis, current limiting fuse (CLF) model was developed using the ATP-Draw program. The violent activation of arc is affected by the voltage level, the voltage rise rate when the arcing starts, and the minimum and the maximum positions of the arcing energy that can be moved to zero degree by the X/R, and the more severe interrupted condition has to be considered. The model developed using ATP-Draw enables a non-expert to use it without spending excessive time and effort. |
doi_str_mv | 10.1109/TDEI.2010.5658232 |
format | article |
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To perform this analysis, current limiting fuse (CLF) model was developed using the ATP-Draw program. The violent activation of arc is affected by the voltage level, the voltage rise rate when the arcing starts, and the minimum and the maximum positions of the arcing energy that can be moved to zero degree by the X/R, and the more severe interrupted condition has to be considered. The model developed using ATP-Draw enables a non-expert to use it without spending excessive time and effort.</description><identifier>ISSN: 1070-9878</identifier><identifier>EISSN: 1558-4135</identifier><identifier>DOI: 10.1109/TDEI.2010.5658232</identifier><identifier>CODEN: ITDIES</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Activation energy ; arcing energy ; Circuit faults ; Clearing ; Constraining ; current limiting fuses ; Dielectrics ; Electric potential ; Electrical insulation ; fault current ; Fault currents ; Fuses ; High voltages ; Immune system ; Limiting ; Mathematical model ; Modeling ; power factor ; prospective current ; Voltage ; Voltage control ; X/R</subject><ispartof>IEEE transactions on dielectrics and electrical insulation, 2010-12, Vol.17 (6), p.1806-1813</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The model developed using ATP-Draw enables a non-expert to use it without spending excessive time and effort.</description><subject>Activation energy</subject><subject>arcing energy</subject><subject>Circuit faults</subject><subject>Clearing</subject><subject>Constraining</subject><subject>current limiting fuses</subject><subject>Dielectrics</subject><subject>Electric potential</subject><subject>Electrical insulation</subject><subject>fault current</subject><subject>Fault currents</subject><subject>Fuses</subject><subject>High voltages</subject><subject>Immune system</subject><subject>Limiting</subject><subject>Mathematical model</subject><subject>Modeling</subject><subject>power factor</subject><subject>prospective current</subject><subject>Voltage</subject><subject>Voltage control</subject><subject>X/R</subject><issn>1070-9878</issn><issn>1558-4135</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNpdkEtLw0AQgBdRsFZ_gHhZ8OIldR_ZR46ltloo6KGew2Yzabfk5W6i-O9NaPXgaV7fDMOH0C0lM0pJ8rh9Wq5njAylkEIzzs7QhAqho5hycT7kRJEo0UpfoqsQDoTQWDA5Qat525bOms41NW4KvHe7Pf5sys7sANvee6g7XLrKda7e4aIPgKsmhxL3YWzMt29R7s3XNbooTBng5hSn6H213C5eos3r83ox30SWM9lFSgquijxm2kihhGBxoiGOE25lkikqM8iSHKgRVuWZESS3KhG0sIKC4hloPkUPx7utbz56CF1auWChLE0NTR9SKhVlTGg-ovf_0EPT-3r4LqWEE6qU1iNFj5T1TQgeirT1rjL-e4DS0Ww6mk1Hs-nJ7LBzd9xxAPDH_05_AK80cx8</recordid><startdate>201012</startdate><enddate>201012</enddate><creator>Lee, Sei-Hyun</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201012</creationdate><title>Application of high voltage current limiting fuse model using ATP-draw</title><author>Lee, Sei-Hyun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c326t-76537fd428a657552498e4493c69b716beb9de1a5c7dba50dc7951fc51e73be83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Activation energy</topic><topic>arcing energy</topic><topic>Circuit faults</topic><topic>Clearing</topic><topic>Constraining</topic><topic>current limiting fuses</topic><topic>Dielectrics</topic><topic>Electric potential</topic><topic>Electrical insulation</topic><topic>fault current</topic><topic>Fault currents</topic><topic>Fuses</topic><topic>High voltages</topic><topic>Immune system</topic><topic>Limiting</topic><topic>Mathematical model</topic><topic>Modeling</topic><topic>power factor</topic><topic>prospective current</topic><topic>Voltage</topic><topic>Voltage control</topic><topic>X/R</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Sei-Hyun</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on dielectrics and electrical insulation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Sei-Hyun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Application of high voltage current limiting fuse model using ATP-draw</atitle><jtitle>IEEE transactions on dielectrics and electrical insulation</jtitle><stitle>T-DEI</stitle><date>2010-12</date><risdate>2010</risdate><volume>17</volume><issue>6</issue><spage>1806</spage><epage>1813</epage><pages>1806-1813</pages><issn>1070-9878</issn><eissn>1558-4135</eissn><coden>ITDIES</coden><abstract>This paper presents the results of arcing energy by the initiation of arcing, the arc clearing voltage, the system impedance (X/R), and the making angle. To perform this analysis, current limiting fuse (CLF) model was developed using the ATP-Draw program. The violent activation of arc is affected by the voltage level, the voltage rise rate when the arcing starts, and the minimum and the maximum positions of the arcing energy that can be moved to zero degree by the X/R, and the more severe interrupted condition has to be considered. The model developed using ATP-Draw enables a non-expert to use it without spending excessive time and effort.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TDEI.2010.5658232</doi><tpages>8</tpages></addata></record> |
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subjects | Activation energy arcing energy Circuit faults Clearing Constraining current limiting fuses Dielectrics Electric potential Electrical insulation fault current Fault currents Fuses High voltages Immune system Limiting Mathematical model Modeling power factor prospective current Voltage Voltage control X/R |
title | Application of high voltage current limiting fuse model using ATP-draw |
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