Normal and Lateral Force Calibration Techniques for AFM Cantilevers

Atomic force microscopy (AFM) is a useful tool, not only for imaging but also for quantification of normal and lateral forces exerted on the AFM tip while interacting with the surface of materials. In order to measure these forces, an accurate determination of the normal and lateral forces exerted o...

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Bibliographic Details
Published in:Critical reviews in solid state and materials sciences 2010-04, Vol.35 (2), p.73-104
Main Authors: Palacio, Manuel L. B., Bhushan, Bharat
Format: Article
Language:English
Subjects:
AFM cantilevers
Atomic force microscopes
Atomic force microscopy
Calibration
Exact sciences and technology
friction
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
lateral force
Materials science
Measurement
Microscopy
Physics
Scanning probe microscopes, components and techniques
Solid state
stiffness
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Summary:Atomic force microscopy (AFM) is a useful tool, not only for imaging but also for quantification of normal and lateral forces exerted on the AFM tip while interacting with the surface of materials. In order to measure these forces, an accurate determination of the normal and lateral forces exerted on the AFM cantilever is necessary. To date, there is no generally accepted technique for the force calibration of AFM cantilevers. In this paper, we present a critical review of various techniques for measuring cantilever stiffness in the normal and lateral/torsional directions in order to calibrate the normal and lateral forces exerted on AFM cantilevers. The key concepts of each technique are presented, along with a discussion of their advantages and disadvantages. An understanding of the issues involved in the determination of the stiffness is needed for the proper choice and implementation of any given technique.
ISSN:1040-8436
1547-6561
2331-4583
DOI:10.1080/10408430903546691